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"A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and ..."

Jaegyeong Cha et al. (2020)

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DOI: 10.1109/IDSTA50958.2020.9264135

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-15

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  dblp key:
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Jaegyeong Cha, Seokju Oh, Donghyun Kim, Jongpil Jeong:
A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. IDSTA 2020: 28-33

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