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Tran Hong Van Nguyen

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Journal Articles

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2023
[j3]
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  - journals/candie/ChienNLC23
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  - https://dblp.org/rec/journals/candie/ChienNLC23
Chen-Fu Chien, Tran Hong Van Nguyen, Yi-Chiu Li, Ying-Jen Chen:
Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. Comput. Ind. Eng. 182: 109421 (2023)
[j2]
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Tran Hong Van Nguyen, Pei-Min Huang, Chen Fu Chien, Chung-Kai Chang:
Digital transformation for cost estimation system via meta-learning and an empirical study in aerospace industry. Comput. Ind. Eng. 184: 109558 (2023)
2022
[j1]
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Chen-Fu Chien, Wei-Tse Hung, Chin-Wei Pan, Tran Hong Van Nguyen:
Decision-based virtual metrology for advanced process control to empower smart production and an empirical study for semiconductor manufacturing. Comput. Ind. Eng. 169: 108245 (2022)

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