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Grazia Sasso

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Journal Articles

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2015
[j3]
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Gerhard G. Fischer, Grazia Sasso:
Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions. Microelectron. Reliab. 55(3-4): 498-507 (2015)
[j2]
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Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux:
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55(9-10): 1433-1437 (2015)
2010
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Grazia Sasso, Maurizio Costagliola, Niccolò Rinaldi:
Avalanche multiplication and pinch-in models for simulating electrical instability effects in SiGe HBTs. Microelectron. Reliab. 50(9-11): 1577-1580 (2010)

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