default search action

combined dblp search
author search
venue search
publication search

ask others

Bert Verlinden

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

Journal Articles

see FAQ

What is the meaning of the colors in the publication lists?

2012
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/DimcicLMVCVW12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DimcicLMVCVW12
Biljana Dimcic, Riet Labie, Joke De Messemaeker, Kris Vanstreels, Kris Croes, Bert Verlinden, Ingrid De Wolf:
Diffusion growth of Cu₃Sn phase in the bump and thin film Cu/Sn structures. Microelectron. Reliab. 52(9-10): 1971-1974 (2012)
2010
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/YangLLZROTVW10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/YangLLZROTVW10
Y. Yang, Riet Labie, F. Ling, C. Zhao, A. Radisic, Jan Van Olmen, Youssef Travaly, Bert Verlinden, Ingrid De Wolf:
Processing assessment and adhesion evaluation of copper through-silicon vias (TSVs) for three-dimensional stacked-integrated circuit (3D-SIC) architectures. Microelectron. Reliab. 50(9-11): 1636-1640 (2010)
2008
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/YangBASVW08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/YangBASVW08
Yu Yang, Hugo Bender, Kai Arstila, Bart Swinnen, Bert Verlinden, Ingrid De Wolf:
Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures. Microelectron. Reliab. 48(8-9): 1517-1520 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.