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Leo van Marwijk

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Journal Articles

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2008
[j2]
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  - journals/mr/LiMN08
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  - https://dblp.org/rec/journals/mr/LiMN08
Yuan Li, Leo van Marwijk, Som Nath:
Fast electromigration wafer mapping for wafer fab process monitoring and improvement. Microelectron. Reliab. 48(8-9): 1388-1392 (2008)
2004
[j1]
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Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper:
Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectron. Reliab. 44(8): 1269-1273 (2004)

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