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James S. Tandon
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Journal Articles
- 2014
- [j1]Satoshi Komatsu, Takahiro J. Yamaguchi, Mohamed Abbas, Nguyen Ngoc Mai Khanh, James S. Tandon, Kunihiro Asada:
A Flash TDC with 2.6-4.2ps Resolution Using a Group of UnbalancedCMOS Arbiters. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 97-A(3): 777-780 (2014)
Conference and Workshop Papers
- 2023
- [c8]James S. Tandon:
Beyond Integer Quantization: Approximate Arithmetic for Machine Learning Accelerators : (Invited Paper). ICICDT 2023: 6-9 - 2016
- [c7]James S. Tandon, Satoshi Komatsu, Takahiro J. Yamaguchi, Kunihiro Asada:
A comparative study of body biased time-to-digital converters based on stochastic arbiters and stochastic comparators. NEWCAS 2016: 1-4 - 2014
- [c6]Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada:
A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge. ATS 2014: 168-173 - [c5]James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada:
A subsampling stochastic coarse-fine ADC with SNR 55.3dB and >5.8TS/s effective sample rate for an on-chip signal analyzer. ISCAS 2014: 93-96 - 2013
- [c4]James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada:
A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset. CICC 2013: 1-4 - [c3]Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada:
A novel test structure for measuring the threshold voltage variance in MOSFETs. ITC 2013: 1-8 - 2012
- [c2]James S. Tandon, Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada:
A design-for-test apparatus for measuring on-chip temperature with fine granularity. ISQED 2012: 27-32 - 2008
- [c1]James S. Tandon, Steven E. Butner:
Bounding Communication Energy Overhead in Parallel Networks with Power-Delay Scalability. ICPADS 2008: 891-895
Coauthor Index
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