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"A design-for-test apparatus for measuring on-chip temperature with fine ..."
James S. Tandon et al. (2012)
- James S. Tandon, Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada:
A design-for-test apparatus for measuring on-chip temperature with fine granularity. ISQED 2012: 27-32
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