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Y. Raskin

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2017
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M. Lisiansky, Y. Raskin, Y. Roizin, B. Meyler, S. Yofis, Y. Shneider:
Peculiarities of hole trapping in Al₂O₃-SiO₂ gate dielectric stack. Microelectron. Reliab. 79: 265-269 (2017)

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