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"Peculiarities of hole trapping in ..."
M. Lisiansky et al. (2017)
- M. Lisiansky, Y. Raskin, Y. Roizin, B. Meyler, S. Yofis, Y. Shneider:
Peculiarities of hole trapping in Al2O3-SiO2 gate dielectric stack. Microelectron. Reliab. 79: 265-269 (2017)
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