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Ygor Aguiar

Ygor Q. Aguiar – Y. Q. de Aguiar – Ygor Q. de Aguiar

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Journal Articles

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2018
[j4]
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  - journals/mr/AguiarWALSTP18
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  - https://dblp.org/rec/journals/mr/AguiarWALSTP18
Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget:
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018)
2017
[j3]
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  - journals/mr/BartraAMVR17
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Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis:
Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectron. Reliab. 76-77: 655-659 (2017)
[j2]
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Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. 76-77: 660-664 (2017)
2016
[j1]
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Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Permanent and single event transient faults reliability evaluation EDA tool. Microelectron. Reliab. 64: 63-67 (2016)

Conference and Workshop Papers

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2020
[c6]
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  - conf/dtis/GuagliardoWAALS20
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S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul:
Effect of Temperature on Single Event Latchup Sensitivity. DTIS 2020: 1-5
2017
[c5]
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  - conf/icecsys/AguiarZMR17
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Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. ICECS 2017: 270-273
[c4]
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Y. Q. de Aguiar, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
SET response of FinFET-based majority voter circuits under work-function fluctuation. ICECS 2017: 282-285
[c3]
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Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Robustness of Sub-22nm multigate devices against physical variability. ISCAS 2017: 1-4
[c2]
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Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis:
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. LASCAS 2017: 1-4
2016
[c1]
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Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Geometric variability impact on 7nm Trigate combinational cells. ICECS 2016: 9-12

Coauthor Index

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