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Jean-Michel Pou

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2020
[j6]
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  - journals/imm/PouL20
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Jean-Michel Pou, Laurent Leblond:
Why smart metrology is no longer optional. IEEE Instrum. Meas. Mag. 23(2): 82-86 (2020)
2018
[j5]
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Jean-Michel Pou, Laurent Leblond:
ISO / IEC guide 98-4: A copernican revolution for metrology. IEEE Instrum. Meas. Mag. 21(5): 6-10 (2018)
2017
[j4]
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Jean-Michel Pou:
A smart approach to calibration - why we should forget calendar-based calibrations. IEEE Instrum. Meas. Mag. 20(2): 11-12 (2017)
[j3]
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Jean-Michel Pou:
The Metrologist's place is by the machines! IEEE Instrum. Meas. Mag. 20(5): 10-29 (2017)
[j2]
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  - journals/imm/LazzariPDL17
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Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond:
Smart metrology: the importance of metrology of decisions in the big data era. IEEE Instrum. Meas. Mag. 20(6): 22-29 (2017)
2016
[j1]
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  - journals/imm/DuBoisLPF16
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Christopher DuBois, Laurent Leblond, Jean-Michel Pou, Alessandro Ferrero:
Covariance evaluation by means of uncertainty assessment. IEEE Instrum. Meas. Mag. 19(6): 12-18 (2016)

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