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IEEE Instrumentation & Measurement Magazine, Volume 21
Volume 21, Number 1, February 2018
- Leopoldo Angrisani, Pasquale Arpaia, Francesco Bonavolontà
, Rosario Schiano Lo Moriello:
Academic FabLabs for industry 4.0: Experience at University of Naples Federico II. 6-13 - Wendy Van Moer:
2018?? Already?? [Editorial]. 2 - Ilkka Korhonen, Jero Ahola
:
Estimating the specific heat capacity and heating of electronic sensors and devices. 54-62 - Yongsheng Yang, Meisu Zhong, Haiqing Yao, Fang Yu, Xiuwen Fu, Octavian Postolache
:
Internet of things for smart ports: Technologies and challenges. 34-43 - Erik Timpson:
Succession to a maker [After Lifegraduation]. 32-33 - Greis F. M. Silva-Calpa
, Carina da Cruz Teixeira, Felipe C. Marx, Jauvane Cavalcante de Oliveira, Shervin Shirmohammadi
:
A 3D-printable instrument to improve force vector measurement in CPR training. 25-33 - Richard Davis:
Zeroth laws- hiding in plain sight [Basicmetrology]. 14-16 - George Xiao:
TC-42 Photonic Technology in Instrumentation and Measurement [Society News]. 61-62 - Ferdinanda Ponci
, Abhinav Sadu, Robert Uhl
, Markus Mirz
, Andrea Angioni
, Antonello Monti
:
Instrumentation and measurement testing in the real-time lab for automation of complex power systems. 17-24 - Luca Parvis:
Length measurements in ancient Greece: Human standards in the golden age of the Olympic Games. 46-49 - Santiago Barcon:
I&M in energy efficiency [Trends in Future I&M]. 44-45 - J. Max Cortner:
New Year, continuing the journey [President's Message]. 3 - Roberto Ferrero
, Elizabeth Beattie, Joanne Phoenix:
Sensor city- A global innovation hub for sensor technology. 4-16 - Robert M. Goldberg:
New products. 63-67 - Jaspal Singh, Rajender K. Sharma:
Making sleep study instrumentation more unobtrusive. 50-53
Volume 21, Number 2, April 2018
- Aimé Lay-Ekuakille, Mohamed Khalil:
Guest editorial [I&M in Ultrasound Technology]. 3 - Patrick Kapita Mvemba, Simon Kidiamboko Guwa Gua Band, Aimé Lay-Ekuakille, Nicola Ivan Giannoccaro
:
Advanced acoustic sensing system on a mobile robot: design, construction and measurements. 4-9 - Dalia Mahdy, Ramez R. Moustafa, Nabila Hamdi, Islam S. M. Khalil:
Ultrasound-guided minimally invasive grinding for clearing blood clots: promises and challenges. 10-14 - Erik Timpson:
Life after graduation [Africa - Where Metrology Began]. 15 - Mark Vaes, Yves Rolain, Johan Pattyn, Gerd Vandersteen
:
Experimentally driven demystification of system identification for nonlinear mechanical systems. 16-25 - Richard Davis:
The last measurement of the speed of light [Basicmetrology]. 26-28 - Giovanni Artale, Antonio Cataliotti, Valentina Cosentino, Dario Di Cara, Riccardo Fiorelli, Salvatore Guaiana, Nicola Panzavecchia
, Giovanni Tinè:
A new low cost power line communication solution for smart grid monitoring and management. 29-33 - Irina Florea:
The need for standardization in instrumentation and measurement [Future Trends in I&M]. 34-35 - Ruqiang Yan:
TC-39 measurements in power systems [Society News]. 36 - Robert M. Goldberg:
New products. 39-43
Volume 21, Number 3, June 2018
- Wendy Van Moer:
STEM education [Editorial]. 2 - Ruth G. Dyer:
STEM education and its impact on Instrumentation and Measurement [Guest editorial]. 3 - Chardie L. Baird:
Male-dominated stem disciplines: How do we make them more attractive to women? 4-14 - Jacqueline Spears:
Integrating the engineering design process into K-12 schools: The Kansas experience. 15-19 - Janet K. Lumpp, Whitney C. Blackburn-Lynch, Doug J. Klein, Laura M. Letellier, Jennifer L. Lovely, Neil F. Moore, Julie G. Whitney:
Instrumentation and measurement in a first-year engineering program. 20-35 - Lieven Philips:
Discovering the real world hands-on in the classroom. 25-27 - Richard Davis:
Analog Computers [Basic metrology]. 28-30 - Erik Timpson:
Igniting STEM in Kansas City. 31-35 - Heidi Knipprath, Lieve Thibaut, Marie-Paule Buyse, Stijn Ceuppens, Haydee De Loof, Jolien De Meester
, Leen Goovaerts
, Annemie Struyf
, Jelle Boeve-De Pauw
, Fien Depaepe
, Johan Deprez
, Mieke De Cock
, Luc Hellinckx, Greet Langie, Katrien Struyven
, Didier Van De Velde, Peter Van Petegem
, Wim Dehaene:
STEM education in Flanders: Literacy and a positive attitude towards STEM. 36-40 - Laura Florea:
Future trends in early diagnosis for cognition impairments in children based on eye measurements [Trends in Future I&M]. 41-42 - Robert M. Goldberg:
New products. 46-50
Volume 21, Number 4, August 2018
- J. Max Cortner, Giuseppe Fabrizio:
Welcome to IEEE AUTOTESTCON 2018 [President's Message]. 3 - Neal Young, Ronald Drees:
Cyber security for automatic test equipment. 4-8 - Ion Neag, Chris Gorringe:
A .NET fluent interface for signal-oriented test programming. 13-19 - Melanie Po-Leen Ooi
:
The past and future of electronics testing [Trends in Future I&M]. 20-21 - William J. Headrick, Gilberto Garcia:
Automated configuration of modern ATE. 22-26 - John W. Sheppard
, Shane Strasser:
Multiple fault diagnosis using factored evolutionary algorithms. 27-38 - Richard Davis:
The center of a souffle-metrology in the kitchen [Basic metrology]. 39-40 - Christopher P. Heagney:
Digital radio frequency memory synthetic instrument enhancing US navy automated test equipment mission. 41-63 - Sergio Saponara
, Fabio Fusi, Simona Saponara
, Massimo Macucci, Voicu Groza:
Interference measurements and failure analysis of patch-clamp laboratory instrumentation for electrophysiology tests. 50-57 - Simona Salicone:
2016 Faculty course development award: Measurement architectures for electric systems. 58-63 - Robert M. Goldberg:
New products. 64-68
Volume 21, Number 5, October 2018
- J. Max Cortner:
Society Successes! [President's Message]. 4-5 - Jean-Michel Pou, Laurent Leblond:
ISO / IEC guide 98-4: A copernican revolution for metrology. 6-10 - Sanna Gaspard:
Healthcare innovations for low and medium income countries or environments today and visions for the future. 11-18 - David Macii, Mauro Hueller:
2016 faculty course development award: application-oriented IM teaching based on industrial electronics and instrumentation at the University of Trento. 20-26 - Kim R. Fowler, Stephen A. Dyer:
2015 faculty course development award: an introductory graduate course in sensors and systems. 27-31 - Vincenzo Marletta:
An Unknown Territory to Explore! 32 - Steve Hutson, Simon Petts, David Hudson:
Measuring the motions of a foucault pendulum. 33-38 - Arvind Rajan:
Bridging the I&M and design optimization communities. 39-40 - Yuxiang Jiang, Haiwei Dong, Houda Almansour, Hossam Mohamed, Abdulmotaleb El-Saddik
:
A unipolar pulse electromagnetic field apparatus for magnetic therapy. 41-48 - Richard Davis:
Gustave Eiffel's wind tunnel. 49-51 - Oladapo O. Ogidi
, Paul S. Barendse, Mohamed Azeem Khan:
Measuring fault indicators in electric machines - learning experience. 52-53 - Daniel Pasquet:
The Bordeaux student branch BEE week: Bordeaux, France Nov. 15-17 - Robert M. Goldberg:
New Products. 56-6 2017. 54-55
Volume 21, Number 6, December 2018
- Wendy Van Moer:
Industry 4.0 and IoT [Editorial]. 2 - Mauro Serpelloni
, Paolo Ferrari:
The fourth industrial revolution [Guest Editorial]. 3 - Carmelo Scuro
, Paolo F. Sciammarella, Francesco Lamonaca
, Renato S. Olivito, Domenico Luca Carnì:
IoT for structural health monitoring. 4-14 - Alberto Fornaser, Teruhiro Mizumoto, Hirohiko Suwa, Keiichi Yasumoto
, Mariolino De Cecco
:
The influence of measurements and feature types in automatic micro-behavior recognition in meal preparation. 10-14 - Paolo Bellagente
, Federico Bonafini, Claudio Crema
, Alessandro Depari, Paolo Ferrari, Alessandra Flammini, Giovanni Lenzi, Marco Pasetti
, Stefano Rinaldi, Emiliano Sisinni
:
Enhancing access to industrial iot measurements by means of location based services. 15-21 - Paolo Chiariotti
, Matteo Fitti, Paolo Castellini, Saverio Zitti, Marco Zannini, Nicola Paone:
Smart quality control station for non-contact measurement of cylindrical parts based on a confocal chromatic sensor. 22-28 - Francis Griffiths, Melanie Po-Leen Ooi
:
The fourth industrial revolution - Industry 4.0 and IoT [Trends in Future I&M]. 29-43 - Thomas Gorham, Damian Loya, Brett Nurnberg, Wesley Thomas, Kim R. Fowler:
Senior design of an autonomous ledge cleaner. 31-35 - Mohammed Ahmed Subhi
, Sawal Hamid Ali
, Ahmad G. Ismail, Masuri Othman:
Food volume estimation based on stereo image analysis. 36-43 - Mahdi Guermazi, Ahmed Fendri
, Olfa Kanoun, Nabil Derbel:
Potential of impedance spectroscopy for real-time assessing of food quality. 44-48 - Richard Davis
:
Why the Mohs scale remains relevant for metrology [Basic Metrology]. 49-51 - Harold Kirkham, D. Rod White:
Pure and applied measurement: The need for expanded education. 52-59 - Vincenzo Marletta:
No fear! [After Life Graduation]. 60-61 - Robert M. Goldberg:
New products. 63-67
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