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M. Chahal

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2010 – 2019

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2015
[c2]
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Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan:
Transistor aging and reliability in 14nm tri-gate technology. IRPS 2015: 2
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Stephen Ramey, M. Chahal, P. Nayak, Steven R. Novak, Chetan Prasad, Jeffery Hicks:
Transistor reliability variation correlation to threshold voltage. IRPS 2015: 3

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