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ORCIDSrinivasan Raghavan 0002
Person information
- affiliation: Indian Institute of Science, Centre for Nano Science and Engineering (CeNSE), Bangalore, India
Other persons with the same name
- Raghavan Srinivasan 0001
![[0000-0001-8375-6038]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0001-8375-6038")
(aka: Srinivasan Raghavan 0001) — Texas A&M University, Department of Ecosystem Science and Management, TX, USA - Srinivasan Raghavan 0003 — teradata Labs, Santa Clara, CA, USA
- Srinivasan Raghavan 0004 — LNK Corporation Inc., Riverdale, MD, USA
- Srinivasan Raghavan 0005 — University of Windsor, ON, Canada
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2020 – today
- 2023
[i1]Ankit Rao, Sooraj Sanjay, Majid Ahmadi, Anirudh Venugopalrao, Navakanta Bhat, Bart Kooi, Srinivasan Raghavan, Pavan Nukala:
Self-assembled neuromorphic networks at self-organized criticality in Ag-hBN platform. CoRR abs/2301.01619 (2023)
2010 – 2019
- 2019
- [c4]Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava:
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. IRPS 2019: 1-5 - [c3]Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava:
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. IRPS 2019: 1-6 - 2018
- [c2]Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, Heena Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava:
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS 2018: 4 - 2017
- [c1]Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava:
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSID 2017: 361-365 - 2015
- [j1]Vidya Kochat, Anindita Sahoo, Atindra Nath Pal, Sneha Eashwer, Gopalakrishnan Ramalingam, Arjun Sampathkumar, Ryugu Tero, Tran Viet Thu, Sanjeev Kaushal, Hiroshi Okada, Adarsh Sandhu, Srinivasan Raghavan, Arindam Ghosh:
Origin of 1/f noise in graphene produced for large-scale applications in electronics. IET Circuits Devices Syst. 9(1): 52-58 (2015)
Coauthor Index
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