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Woohyun Chung
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2020 – today
- 2024
- [j4]Chihyun Cho, Jae-Yong Kwon, Tae-Weon Kang, Hyunji Koo, Woohyun Chung:
Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty. IEEE Access 12: 12902-12908 (2024) - [j3]Chihyun Cho, Tae-Weon Kang, Hyunji Koo, Woohyun Chung:
Evaluation of Random Errors for Vector Network Analyzers Based on a Residual Model. IEEE Trans. Instrum. Meas. 73: 1-6 (2024)
2010 – 2019
- 2019
- [j2]Jinwook Jung, Gi-Joon Nam, Woohyun Chung, Youngsoo Shin:
Integrated Latch Placement and Cloning for Timing Optimization. ACM Trans. Design Autom. Electr. Syst. 24(2): 22:1-22:17 (2019) - 2017
- [j1]Seongbo Shim, Woohyun Chung, Youngsoo Shin:
Lithography Defect Probability and Its Application to Physical Design Optimization. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 271-285 (2017) - 2016
- [c5]Seongbo Shim, Woohyun Chung, Youngsoo Shin:
Redundant via insertion for multiple-patterning directed-self-assembly lithography. DAC 2016: 41:1-41:6 - [c4]Woohyun Chung, Seongbo Shim, Youngsoo Shin:
Redundant via insertion in directed self-assembly lithography. DATE 2016: 55-60 - [c3]Seongbo Shim, Woohyun Chung, Youngsoo Shin:
Placement optimization for MP-DSAL compliant layout. ICICDT 2016: 1-4 - 2015
- [c2]Woohyun Chung, Seongbo Shim, Youngsoo Shin:
Identifying redundant inter-cell margins and its application to reducing routing congestion. DATE 2015: 1659-1664 - [c1]Seongbo Shim, Woohyun Chung, Youngsoo Shin:
Defect Probability of Directed Self-Assembly Lithography: Fast Identification and Post-Placement Optimization. ICCAD 2015: 404-409
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last updated on 2024-11-18 21:46 CET by the dblp team
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