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Matteo Buffolo
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2020 – today
- 2023
- [j10]Alexander Herzog
, Simon Benkner
, Babak Zandi
, Matteo Buffolo
, Willem D. van Driel
, Matteo Meneghini
, Tran Quoc Khanh
:
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes. IEEE Access 11: 19928-19940 (2023) - 2021
- [j9]Nicola Trivellin
, Matteo Buffolo
, Carlo De Santi
, Matteo Meneghini
, Michele Forzan
, Fabrizio Dughiero
, Enrico Zanoni
, Gaudenzio Meneghesso
:
Full Optical Contactless Thermometry Based on LED Photoluminescence. IEEE Trans. Instrum. Meas. 70: 1-8 (2021) - [c2]Nicola Trivellin, Matteo Buffolo
, Carlo De Santi
, Enrico Zanoni
, Gaudenzio Meneghesso, Matteo Meneghini:
Current crowding as a major cause for InGaN LED degradation at extreme high current density. IECON 2021: 1-6
2010 – 2019
- 2018
- [j8]Matteo Buffolo
, M. Pietrobon, Carlo De Santi
, F. Samparisi, Michael L. Davenport, John E. Bowers, Gaudenzio Meneghesso, Enrico Zanoni
, Matteo Meneghini
:
Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectron. Reliab. 88-90: 855-858 (2018) - [j7]Nicola Trivellin
, Desiree Monti, Carlo De Santi
, Matteo Buffolo
, Gaudenzio Meneghesso, Enrico Zanoni
, Matteo Meneghini
:
Current induced degradation study on state of the art DUV LEDs. Microelectron. Reliab. 88-90: 868-872 (2018) - [j6]N. Renso, Matteo Buffolo
, Carlo De Santi
, M. Ronzani, Gaudenzio Meneghesso, Enrico Zanoni
, Matteo Meneghini
:
Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress. Microelectron. Reliab. 88-90: 887-890 (2018) - 2017
- [j5]N. Renso, Matteo Meneghini
, Matteo Buffolo
, Carlo De Santi
, Gaudenzio Meneghesso, Enrico Zanoni
:
Understanding the degradation processes of GaN based LEDs submitted to extremely high current density. Microelectron. Reliab. 76-77: 556-560 (2017) - 2016
- [j4]Matteo Buffolo
, Matteo Meneghini
, Carlo De Santi
, Henry Felber, N. Renso, Gaudenzio Meneghesso, Enrico Zanoni
:
Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs. Microelectron. Reliab. 64: 610-613 (2016) - 2015
- [j3]Matteo Buffolo
, Carlo De Santi
, Matteo Meneghini
, D. Rigon, Gaudenzio Meneghesso, Enrico Zanoni
:
Long-term degradation mechanisms of mid-power LEDs for lighting applications. Microelectron. Reliab. 55(9-10): 1754-1758 (2015) - [j2]Carlo De Santi
, Matteo Dal Lago, Matteo Buffolo
, Desiree Monti, Matteo Meneghini
, Gaudenzio Meneghesso, Enrico Zanoni
:
Failure causes and mechanisms of retrofit LED lamps. Microelectron. Reliab. 55(9-10): 1765-1769 (2015) - [c1]Carlo De Santi
, Matteo Dal Lago, Matteo Buffolo
, Matteo Meneghini
, Gaudenzio Meneghesso, Enrico Zanoni
:
Analysis of the mechanisms limiting the reliability of retrofit LED lamps. RTSI 2015: 1-4 - 2014
- [j1]Carlo De Santi
, Matteo Meneghini
, Michael Marioli, Matteo Buffolo
, Nicola Trivellin
, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni
:
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. Microelectron. Reliab. 54(9-10): 2147-2150 (2014)
Coauthor Index
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