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ORCIDStephane David-Grignot
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Journal Articles
- 2018
[j4]Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier
, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard:
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34(3): 281-290 (2018)- 2016
- [j3]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. 32(1): 69-82 (2016) - [j2]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25(3): 1640014:1-1640014:18 (2016) - 2015
- [j1]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. 31(5-6): 443-459 (2015)
Conference and Workshop Papers
- 2018
- [c6]Achraf Lamlih, Philippe Freitas, Stephane David-Grignot, Jérémie Salles, Vincent Kerzèrho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau:
Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements. ISCAS 2018: 1-5 - 2015
- [c5]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS 2015: 237-242 - [c4]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS 2015: 1-6 - [c3]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS 2015: 1-6 - 2014
- [c2]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC 2014: 1-9 - [c1]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS 2014: 121-124
Coauthor Index
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