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Giovanni M. Paolucci

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Books and Theses

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2015
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Giovanni M. Paolucci:
Impact of few-electron phenomena on the operation and reliability of nanoscale Flash memories. Polytechnic University of Milan, Italy, 2015

Conference and Workshop Papers

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2015
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Carmine Miccoli, Giovanni M. Paolucci, Christian Monzio Compagnoni, Alessandro S. Spinelli, Akira Goda:
Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays. IRPS 2015: 9
2014
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Giovanni M. Paolucci, M. Bertuccio, C. Monzio Compagnoni, Silvia Beltrami, Alessandro S. Spinelli, Andrea L. Lacaita, Angelo Visconti:
Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern. ESSDERC 2014: 54-57

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