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ORCIDAnthony P. Ambler
Person information
- affiliation: The University of Texas, Department of Electrical and Computer Engineering, Austin, TX, USA
- affiliation: Brunel University, Uxbridge, Middlesex, UK
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Journal Articles
- 1997
[j5]Des Farren, Anthony P. Ambler:
The Economics of System-Level Testing. IEEE Des. Test Comput. 14(3): 51-58 (1997)- 1994
- [j4]I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick:
Test strategy planning using economic analysis. J. Electron. Test. 5(2-3): 137-155 (1994) - [j3]J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler:
Sensitivity analysis in economics based test strategy planning. J. Electron. Test. 5(2-3): 239-251 (1994) - 1993
- [j2]Anthony P. Ambler:
The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222. Microprocess. Microsystems 17(5): 305 (1993) - 1991
- [j1]I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick:
Economic Effects in Design and Test. IEEE Des. Test Comput. 8(4): 64-77 (1991)
Conference and Workshop Papers
- 2009
- [c19]Lftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler:
A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. SNPD 2009: 3-7 - 2006
- [c18]Taikyeong T. Jeong, Anthony P. Ambler:
Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. ICCSA (5) 2006: 531-536 - [c17]Scott Davidson, Anthony P. Ambler, Helen Davidson:
Behavioral Test Economics. ITC 2006: 1-9 - 2005
- [c16]Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler:
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. ISVLSI 2005: 194-199 - [c15]Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler:
Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI 2005: 255-256 - 2002
- [c14]David Williams, Anthony P. Ambler:
System Manufacturing Test Cost Model. ITC 2002: 482-490 - [c13]Anthony P. Ambler:
Is It Rocket Science? ITC 2002: 1188-1189 - 2001
- [c12]Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman:
From DFT to systems test - a model based cost optimization tool. DATE 2001: 302-306 - 1995
- [c11]Des Farren, Anthony P. Ambler:
Cost-Effective System-Level Test Strategies. ITC 1995: 807-813 - 1994
- [c10]Des Farren, Anthony P. Ambler:
System Test Cost Modelling Based on Event Rate Analysis. ITC 1994: 84-92 - 1993
- [c9]Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick:
Economics in Design and Test. ICCD 1993: 384-387 - [c8]Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler:
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC 1993: 210-217 - [c7]Chryssa Dislis, J. H. Dick, Anthony P. Ambler:
Algorithms for Cost Optimised Test Strategy Selection. ITC 1993: 383-391 - 1992
- [c6]Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler:
A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. ITC 1992: 415-421 - 1989
- [c5]Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler:
Cost Analysis of Test Method Environments. ITC 1989: 875-883 - 1988
- [c4]J. R. Miles, Anthony P. Ambler, K. A. E. Totton:
Estimation of area and performance overheads for testable VLSI circuits. ICCD 1988: 402-407 - 1986
- [c3]Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear:
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243 - 1984
- [c2]M. E. Glazier, Anthony P. Ambler:
Ultimate: A hardware logic simulation engine. DAC 1984: 336-342 - [c1]Prab Varma, Anthony P. Ambler, Keith Baker:
An Analysis of the Economics of Self Test. ITC 1984: 20-30
Editorship
- 2000
- [e1]Anthony P. Ambler, Seraphin B. Calo, Gautam Kar:
Services Management in Intelligent Networks, 11th IFIP/IEEE International Workshop on Distributed Systems: Operations and Management, DSOM 2000, Austin, Texas, USA, December 4-6, 2000, Proceedings. Lecture Notes in Computer Science 1960, Springer 2000, ISBN 3-540-41427-4 [contents]
Coauthor Index
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