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"Estimation of area and performance overheads for testable VLSI circuits."

J. R. Miles, Anthony P. Ambler, K. A. E. Totton (1988)

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DOI: 10.1109/ICCD.1988.25732

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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J. R. Miles, Anthony P. Ambler, K. A. E. Totton:
Estimation of area and performance overheads for testable VLSI circuits. ICCD 1988: 402-407

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