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Chuan-Hsi Liu
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2010 – 2019
- 2018
- [j8]Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou:
Editorial: IEDMS 2016. Microelectron. Reliab. 83: 207 (2018) - [j7]Chang-Chun Lee, Chuan-Hsi Liu, Dian-Yong Li, Chia-Ping Hsieh:
Effect of contact-etch-stop-layer and Si1-xGex channel mechanical properties on nano-scaled short channel NMOSFETs with dummy gate arrays. Microelectron. Reliab. 83: 230-234 (2018) - [j6]Kuan-Wei Lee, Chuan-Hsi Liu, Durga Misra:
Wide Bandgap Materials for Semiconductor Devices. Microelectron. Reliab. 91: 306 (2018) - 2015
- [j5]Shea-Jue Wang, Mu-Chun Wang
, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu:
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment. Microelectron. Reliab. 55(11): 2203-2207 (2015) - 2011
- [j4]Lili Hsieh, Wen-Shiung Chen, Chuan-Hsi Liu:
Motion estimation using two-stage predictive search algorithms based on joint spatio-temporal correlation information. Expert Syst. Appl. 38(9): 11608-11623 (2011) - 2010
- [j3]Chuan-Hsi Liu, H. W. Chen:
Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics. Microelectron. Reliab. 50(5): 599-602 (2010) - [j2]H. W. Chen, Chuan-Hsi Liu:
Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics. Microelectron. Reliab. 50(5): 614-617 (2010) - [j1]Mu-Chun Wang
, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin:
Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process. Microelectron. Reliab. 50(6): 839-846 (2010) - [c2]Jen-Yang Chen, Chuan-Hsi Liu, Chang-Wei Fan, Haw-Yun Shin, Mao-Hsu Yen:
An adaptive PID controller. ICMLC 2010: 884-889 - [c1]Chuan-Hsi Liu, Yen-Liang Chen, Jen-Yang Chen:
Ameliorated particle swarm optimization by integrating Taguchi methods. ICMLC 2010: 1823-1828
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