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ORCIDSergei Kostin
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2010 – 2019
- 2018
[j4]Raimund Ubar
, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi:
Fast identification of true critical paths in sequential circuits. Microelectron. Reliab. 81: 252-261 (2018)- [c19]Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik:
Parallel Critical Path Tracing Fault Simulation in Sequential Circuits. MIXDES 2018: 305-310 - [c18]Lembit Jurimagi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Sergei Kostin:
Hierarchical Timing-Critical Paths Analysis in Sequential Circuits. PATMOS 2018: 1-6 - 2017
- [c17]Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik:
A scalable technique to identify true critical paths in sequential circuits. DDECS 2017: 152-157 - [e1]Thomas Hollstein, Jaan Raik, Sergei Kostin, Anton Tsertov, Ian O'Connor, Ricardo Reis:
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability - 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers. IFIP Advances in Information and Communication Technology 508, Springer 2017, ISBN 978-3-319-67103-1 [contents] - 2016
- [j3]Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros:
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32(3): 273-289 (2016) - [c16]Sergei Kostin, Elmet Orasson, Raimund Ubar:
A tool set for teaching design-for-testability of digital circuits. EWME 2016: 1-6 - [c15]Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar:
Gate-level modelling of NBTI-induced delays under process variations. LATS 2016: 75-80 - [c14]Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik:
A novel random approach to diagnostic test generation. NORCAS 2016: 1-4 - 2015
- [c13]Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls:
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. DDECS 2015: 223-228 - [c12]N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls:
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS 2015: 1-6 - 2014
- [c11]Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti:
Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW 2014: 1-6 - 2013
- [j2]Ivo Fridolin, Deniss Karai, Sergei Kostin, Raimund Ubar:
Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring. IEEE Trans. Biomed. Eng. 60(5): 1371-1377 (2013) - [c10]Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls:
Identifying NBTI-Critical Paths in Nanoscale Logic. DSD 2013: 136-141 - [c9]Raimund Ubar, Sergei Kostin, Jaan Raik:
Synthesis of multiple fault oriented test groups from single fault test sets. DTIS 2013: 98-103 - 2012
- [c8]Raimund Ubar, Sergei Kostin, Jaan Raik:
Multiple stuck-at-fault detection theorem. DDECS 2012: 236-241 - [c7]Raimund Ubar, Sergei Kostin, Jaan Raik:
How to Prove that a Circuit is Fault-Free? DSD 2012: 427-430 - [c6]Raimund Ubar, Sergei Kostin, Jaan Raik:
About robustness of test patterns regarding multiple faults. LATW 2012: 1-6 - 2011
- [c5]Sergei Kostin, Raimund Ubar, Jaan Raik:
Defect-oriented module-level fault diagnosis in digital circuits. DDECS 2011: 81-86
2000 – 2009
- 2009
- [c4]Raimund Ubar, Sergei Kostin, Jaan Raik:
Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems. DSD 2009: 229-232 - [c3]Raimund Ubar, Sergei Kostin, Jaan Raik:
Investigations of the diagnosibility of digital networks with BIST. LATW 2009: 1-6 - [c2]Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Kostin, Heinz-Dietrich Wuttke:
Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems. MSE 2009: 12-15 - 2008
- [j1]Raimund Ubar, Sergei Kostin, Jaan Raik:
Embedded fault diagnosis in digital systems with BIST. Microprocess. Microsystems 32(5-6): 279-287 (2008) - 2007
- [c1]Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen:
Fault Diagnosis in Integrated Circuits with BIST. DSD 2007: 604-610
Coauthor Index
aka: Letícia Maria Bolzani Poehls
aka: Letícia Maria Bolzani Pöhls
aka: Leticia Bolzani Poehls
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