Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

Stewart E. Rauch

Stewart E. Rauch III

> Home > Persons

Person information

affiliation: GlobalFoundries Inc, NY, USA

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

Journal Articles

see FAQ

What is the meaning of the colors in the publication lists?

2007
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/RosaR07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/RosaR07
Giuseppe La Rosa, Stewart E. Rauch III:
Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies. Microelectron. Reliab. 47(4-5): 552-558 (2007)

Conference and Workshop Papers

see FAQ

What is the meaning of the colors in the publication lists?

2020
[c4]
- view
  authority control:
- export record
  dblp key:
  - conf/natw/PaliwodaTNGNCPG20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/natw/PaliwodaTNGNCPG20
Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min:
Self-heating characterization and its applications in technology development. NATW 2020: 1-7
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/natw/RauchLVG20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/natw/RauchLVG20
Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta:
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. NATW 2020: 1-4
[c2]
- view
  - electronic edition @ ieee.org
  - no references & citations available
- export record
  dblp key:
  - conf/ofc/RauchLVJM30
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ofc/RauchLVJM30
Stewart E. Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min:
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. OFC 2020: 1-3
2016
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/essderc/SharmaTRFKMVG16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/SharmaTRFKMVG16
Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser:
A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. ESSDERC 2016: 428-431

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.