Nirmal R. Saxena

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Subhasish Mitra

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Publications

2004
[j19]
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Subhasish Mitra, Wei-Je Huang, Nirmal R. Saxena, Shu-Yi Yu, Edward J. McCluskey:
Reconfigurable Architecture for Autonomous Self-Repair. IEEE Des. Test Comput. 21(3): 228-240 (2004)
[j18]
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Efficient Design Diversity Estimation for Combinational Circuits. IEEE Trans. Computers 53(11): 1483-1492 (2004)
2002
[j17]
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
A Design Diversity Metric and Analysis of Redundant Systems. IEEE Trans. Computers 51(5): 498-510 (2002)
2001
[c17]
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Techniques for Estimation of Design Diversity for Combinational Logic Circuits. DSN 2001: 25-36
2000
[j16]
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Nirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra, Shu-Yi Yu, Edward J. McCluskey:
Dependable Computing and Online Testing in Adaptive and Configurable Systems. IEEE Des. Test Comput. 17(1): 29-41 (2000)
[j14]
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Common-mode failures in redundant VLSI systems: a survey. IEEE Trans. Reliab. 49(3): 285-295 (2000)
[c14]
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Fault Escapes in Duplex Systems. VTS 2000: 453-458
1999
[c13]
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  - conf/itc/MetraSM99
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Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
A design diversity metric and reliability analysis for redundant systems. ITC 1999: 662-671

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