Mayank Shrivastava

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Vipin Joshi

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Publications

2023
[c44]
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Rajarshi Roy Chaudhuri, Vipin Joshi, Amratansh Gupta, Tanmay Joshi, Rasik Rashid Malik, Mehak Ashraf Mir, Sayak Dutta Gupta, Mayank Shrivastava:
Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences. IRPS 2023: 1-5
[c41]
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  - conf/irps/JoshiGCS23
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Vipin Joshi, Sayak Dutta Gupta, Rajarshi Roy Chaudhuri, Mayank Shrivastava:
Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer. IRPS 2023: 1-4
[c39]
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  - conf/irps/MalikJCMKSBVS23
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Rasik Rashid Malik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mehak Ashraf Mir, Zubear Khan, Avinas N. Shaji, Madhura Bhattacharya, Anup T. Vitthal, Mayank Shrivastava:
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. IRPS 2023: 1-4
[c38]
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  - conf/irps/MirJCMMS23
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Mehak Ashraf Mir, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Rasik Rashid Malik, Mayank Shrivastava:
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. IRPS 2023: 1-6
[c33]
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  - conf/irps/RajJCMS23
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Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava:
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes. IRPS 2023: 1-4
2020
[c23]
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  - conf/irps/GuptaJCSGS20
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Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava:
On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. IRPS 2020: 1-4
2019
[c17]
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  - conf/irps/GuptaJSSRS19
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Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava:
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. IRPS 2019: 1-5

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