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Chi-Jih Shih

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2010 – 2019

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2014
[j1]
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  - journals/tvlsi/KuoSLLC14
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  - https://dblp.org/rec/journals/tvlsi/KuoSLLC14
Chun-Yi Kuo, Chi-Jih Shih, Yi-Chang Lu, James Chien-Mo Li, Krishnendu Chakrabarty:
Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 22(3): 667-674 (2014)
2013
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Chi-Jih Shih, Shih-An Hsieh, Yi-Chang Lu, James Chien-Mo Li, Tzong-Lin Wu, Krishnendu Chakrabarty:
Test Generation of Path Delay Faults Induced by Defects in Power TSV. Asian Test Symposium 2013: 43-48

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