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Pascal Scafidi

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2000 – 2009

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2007
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Stephane Bianic, Stéphanie Allemand, Grégory Kerrosa, Pascal Scafidi, Didier Renard:
Advanced backside failure analysis in 65 nm CMOS technology. Microelectron. Reliab. 47(9-11): 1550-1554 (2007)

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