BibTeX records: John Van Slyke

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@inproceedings{DBLP:conf/itc/TurakhiaDWS07,
  author       = {Ritesh P. Turakhia and
                  W. Robert Daasch and
                  Mark Ward and
                  John Van Slyke},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Silicon evaluation of longest path avoidance testing for small delay
                  defects},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437564},
  doi          = {10.1109/TEST.2007.4437564},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TurakhiaDWS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04,
  author       = {Brady Benware and
                  Cam Lu and
                  John Van Slyke and
                  Prabhu Krishnamurthy and
                  Robert Madge and
                  Martin Keim and
                  Mark Kassab and
                  Janusz Rajski},
  title        = {Affordable and Effective Screening of Delay Defects in ASICs using
                  the Inline Resistance Fault Model},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {1285--1294},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1387403},
  doi          = {10.1109/TEST.2004.1387403},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BenwareLSKMKKR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}