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ORCIDBibTeX records: Guido Groeseneken
@inproceedings{DBLP:conf/irps/SerbulovaQCGKBG24,
author = {Kateryna Serbulova and
Zi{-}En Qiu and
Shih{-}Hung Chen and
Alexander Grill and
Kuo{-}Hsing Kao and
Jo De Boeck and
Guido Groeseneken},
title = {Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum
Computing Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
TX, USA, April 14-18, 2024},
pages = {1--7},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/IRPS48228.2024.10529388},
doi = {10.1109/IRPS48228.2024.10529388},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SerbulovaQCGKBG24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKBFCMMHG23,
author = {Michiel Vandemaele and
Ben Kaczer and
Erik Bury and
Jacopo Franco and
Adrian Chasin and
Alexander Makarov and
Hans Mertens and
Geert Hellings and
Guido Groeseneken},
title = {Investigating Nanowire, Nanosheet and Forksheet {FET} Hot-Carrier
Reliability via {TCAD} Simulations: Invited Paper},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--10},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118211},
doi = {10.1109/IRPS48203.2023.10118211},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKBFCMMHG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsit/ChenCVSHG23,
author = {Wen{-}Chieh Chen and
S.{-}H. Chen and
Anabela Veloso and
Kateryna Serbulova and
Geert Hellings and
Guido Groeseneken},
title = {Upcoming Challenges of {ESD} Reliability in {DTCO} with {BS-PDN} Routing
via BPRs},
booktitle = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
and Circuits), Kyoto, Japan, June 11-16, 2023},
pages = {1--2},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185389},
doi = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185389},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsit/ChenCVSHG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTBCF22,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Erik Bury and
Adrian Vaisman Chasin and
Jacopo Franco and
Alexander Makarov and
Hans Mertens and
Geert Hellings and
Guido Groeseneken},
title = {Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet
and Forksheet FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764470},
doi = {10.1109/IRPS48227.2022.9764470},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTBCF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HsiehTOYBGKPCW22,
author = {Ping{-}Yi Hsieh and
Artemisia Tsiara and
Barry J. O'Sullivan and
Didit Yudistira and
Marina Baryshnikova and
Guido Groeseneken and
Bernardette Kunert and
Marianna Pantouvaki and
Joris Van Campenhout and
Ingrid De Wolf},
title = {Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically
Integrated on Silicon},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {9},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764597},
doi = {10.1109/IRPS48227.2022.9764597},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HsiehTOYBGKPCW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsit/SerbulovaCHVJLB22,
author = {Kateryna Serbulova and
S.{-}H. Chen and
Geert Hellings and
Anabela Veloso and
Anne Jourdain and
Dimitri Linten and
Jo De Boeck and
Guido Groeseneken and
Julien Ryckaert and
Geert Van der Plas and
Eric Beyne and
Eugenio Dentoni Litta and
Naoto Horiguchi},
title = {Enabling Active Backside Technology for {ESD} and {LU} Reliability
in {DTCO/STCO}},
booktitle = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
pages = {431--432},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830146},
doi = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830146},
timestamp = {Wed, 29 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsit/SerbulovaCHVJLB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/imw2/KaczmarekBXBRPG21,
author = {K. Kaczmarek and
Marie Garcia Bardon and
Y. Xiang and
Laurent Breuil and
Nicolo Ronchi and
Bertrand Parvais and
Guido Groeseneken and
Jan Van Houdt},
title = {Understanding the memory window in 1T-FeFET memories: a depolarization
field perspective},
booktitle = {{IEEE} International Memory Workshop, {IMW} 2021, Dresden, Germany,
May 16-19, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IMW51353.2021.9439597},
doi = {10.1109/IMW51353.2021.9439597},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/imw2/KaczmarekBXBRPG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Jacopo Franco and
Robin Degraeve and
Adrian Vaisman Chasin and
Zhicheng Wu and
Erik Bury and
Yang Xiang and
Hans Mertens and
Guido Groeseneken},
title = {The properties, effect and extraction of localized defect profiles
from degraded {FET} characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405164},
doi = {10.1109/IRPS46558.2021.9405164},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
author = {Zhicheng Wu and
Jacopo Franco and
Brecht Truijen and
Philippe Roussel and
Stanislav Tyaginov and
Michiel Vandemaele and
Erik Bury and
Guido Groeseneken and
Dimitri Linten and
Ben Kaczer},
title = {Physics-based device aging modelling framework for accurate circuit
reliability assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405106},
doi = {10.1109/IRPS46558.2021.9405106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleCBTGK20,
author = {Michiel Vandemaele and
Kai{-}Hsin Chuang and
Erik Bury and
Stanislav Tyaginov and
Guido Groeseneken and
Ben Kaczer},
title = {The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128218},
doi = {10.1109/IRPS45951.2020.9128218},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleCBTGK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/drc/BalajiSLARG19,
author = {Yashwanth Balaji and
Quentin Smets and
Dennis Lin and
I. Asselberghs and
Iuliana P. Radu and
Guido Groeseneken},
title = {Tunnel FETs using Phosphorene/ReS2 heterostructures},
booktitle = {Device Research Conference, {DRC} 2019, Ann Arbor, MI, USA, June 23-26,
2019},
pages = {113--114},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DRC46940.2019.9046420},
doi = {10.1109/DRC46940.2019.9046420},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/drc/BalajiSLARG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/drc/BizindavyiVSSG19,
author = {Jasper Bizindavyi and
Anne S. Verhulst and
Quentin Smets and
Bart Sor{\'{e}}e and
Guido Groeseneken},
title = {Experimental calibration of the temperature dependence of the heterojunction
bandgap in {III-V} tunneling devices},
booktitle = {Device Research Conference, {DRC} 2019, Ann Arbor, MI, USA, June 23-26,
2019},
pages = {253--254},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DRC46940.2019.9046474},
doi = {10.1109/DRC46940.2019.9046474},
timestamp = {Thu, 01 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/drc/BizindavyiVSSG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/YouLDGCLYK19,
author = {Shuzhen You and
Xiangdong Li and
Stefaan Decoutere and
Guido Groeseneken and
Zhanfei Chen and
Jun Liu and
Yuki Yamashita and
Kazutoshi Kobayashi},
title = {Monolithically integrated GaN power ICs designed using the {MIT} virtual
source GaNFET {(MVSG)} compact model for enhancement-mode p-GaN gate
power HEMTs, logic transistors and resistors},
booktitle = {49th European Solid-State Device Research Conference, {ESSDERC} 2019,
Cracow, Poland, September 23-26, 2019},
pages = {158--161},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ESSDERC.2019.8901817},
doi = {10.1109/ESSDERC.2019.8901817},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/YouLDGCLYK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTSMC19,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Zlatan Stanojevic and
Alexander Makarov and
Adrian Vaisman Chasin and
Erik Bury and
Hans Mertens and
Dimitri Linten and
Guido Groeseneken},
title = {Full (V\({}_{\mbox{g}}\), V\({}_{\mbox{d}}\)) Bias Space Modeling
of Hot-Carrier Degradation in Nanowire FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720406},
doi = {10.1109/IRPS.2019.8720406},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTSMC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFCRRCGLGK19,
author = {Zhicheng Wu and
Jacopo Franco and
Dieter Claes and
Gerhard Rzepa and
Philippe J. Roussel and
Nadine Collaert and
Guido Groeseneken and
Dimitri Linten and
Tibor Grasser and
Ben Kaczer},
title = {Accelerated Capture and Emission {(ACE)} Measurement Pattern for Efficient
{BTI} Characterization and Modeling},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720541},
doi = {10.1109/IRPS.2019.8720541},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFCRRCGLGK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tches/ChuangDFGLV18,
author = {Kai{-}Hsin Chuang and
Robin Degraeve and
Andrea Fantini and
Guido Groeseneken and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A Cautionary Note When Looking for a Truly Reconfigurable Resistive
{RAM} {PUF}},
journal = {{IACR} Trans. Cryptogr. Hardw. Embed. Syst.},
volume = {2018},
number = {1},
pages = {98--117},
year = {2018},
url = {https://doi.org/10.13154/tches.v2018.i1.98-117},
doi = {10.13154/TCHES.V2018.I1.98-117},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tches/ChuangDFGLV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/drc/BizindavyiVSG18,
author = {Jasper Bizindavyi and
Anne S. Verhulst and
Bart Soree and
Guido Groeseneken},
title = {Impact of calibrated band-tails on the subthreshold swing of pocketed
TFETs},
booktitle = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA,
June 24-27, 2018},
pages = {1--2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/DRC.2018.8442246},
doi = {10.1109/DRC.2018.8442246},
timestamp = {Mon, 09 Aug 2021 01:32:18 +0200},
biburl = {https://dblp.org/rec/conf/drc/BizindavyiVSG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChuangBDKKGLV18,
author = {Kai{-}Hsin Chuang and
Erik Bury and
Robin Degraeve and
Ben Kaczer and
T. Kallstenius and
Guido Groeseneken and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A multi-bit/cell {PUF} using analog breakdown positions in {CMOS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353655},
doi = {10.1109/IRPS.2018.8353655},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChuangBDKKGLV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PutchaFVKSLG18,
author = {Vamsi Putcha and
Jacopo Franco and
Abhitosh Vais and
Ben Kaczer and
S. Sioncke and
Dimitri Linten and
Guido Groeseneken},
title = {Impact of slow and fast oxide traps on In0.53Ga0.47As device operation
studied using {CET} maps},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353603},
doi = {10.1109/IRPS.2018.8353603},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PutchaFVKSLG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FlorentSLDCKPPG18,
author = {Karine Florent and
A. Subirats and
Simone Lavizzari and
Robin Degraeve and
Umberto Celano and
Ben Kaczer and
Luca Di Piazza and
Mihaela Ioana Popovici and
Guido Groeseneken and
Jan Van Houdt},
title = {Investigation of the endurance of FE-HfO2 devices by means of {TDDB}
studies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353634},
doi = {10.1109/IRPS.2018.8353634},
timestamp = {Sun, 09 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FlorentSLDCKPPG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CatthoorG17,
author = {Francky Catthoor and
Guido Groeseneken},
title = {Will Chips of the Future Learn How to Feel Pain and Cure Themselves?},
journal = {{IEEE} Des. Test},
volume = {34},
number = {5},
pages = {80--87},
year = {2017},
url = {https://doi.org/10.1109/MDAT.2017.2730841},
doi = {10.1109/MDAT.2017.2730841},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/CatthoorG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BalajiSRLCALHRM17,
author = {Yashwanth Balaji and
Quentin Smets and
Cesar J. Lockhart de la Rosa and
Anh Khoa Augustin Lu and
Daniele Chiappe and
Tarun Agarwal and
Dennis Lin and
Cedric Huyghebaert and
Iuliana P. Radu and
Dan Mocuta and
Guido Groeseneken},
title = {Tunneling transistors based on MoS2/MoTe2 Van der Waals heterostructures},
booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
Leuven, Belgium, September 11-14, 2017},
pages = {106--109},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ESSDERC.2017.8066603},
doi = {10.1109/ESSDERC.2017.8066603},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/BalajiSRLCALHRM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/FlorentLPPPRGH17,
author = {Karine Florent and
Simone Lavizzari and
Luca Di Piazza and
Mihaela Ioana Popovici and
Goedele Potoms and
Tom Raymaekers and
Guido Groeseneken and
Jan Van Houdt},
title = {From planar to vertical capacitors: {A} step towards ferroelectric
V-FeFET integration},
booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
Leuven, Belgium, September 11-14, 2017},
pages = {164--167},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ESSDERC.2017.8066617},
doi = {10.1109/ESSDERC.2017.8066617},
timestamp = {Sun, 09 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/FlorentLPPPRGH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/WangCHMSSBLG17,
author = {Nian Wang and
Shih{-}Hung Chen and
Geert Hellings and
Kris Myny and
Soeren Steudel and
Mirko Scholz and
Roman Boschke and
Dimitri Linten and
Guido Groeseneken},
title = {{ESD} characterisation of a-IGZO TFTs on Si and foil substrates},
booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
Leuven, Belgium, September 11-14, 2017},
pages = {276--279},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ESSDERC.2017.8066645},
doi = {10.1109/ESSDERC.2017.8066645},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/WangCHMSSBLG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/VerreckVSCMTG16,
author = {Devin Verreck and
Anne S. Verhulst and
Bart Soree and
Nadine Collaert and
Anda Mocuta and
Aaron Thean and
Guido Groeseneken},
title = {Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect
transistors},
booktitle = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
Lausanne, Switzerland, September 12-15, 2016},
pages = {412--415},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ESSDERC.2016.7599673},
doi = {10.1109/ESSDERC.2016.7599673},
timestamp = {Tue, 28 Mar 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/VerreckVSCMTG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/KuknerWMFTCRKJM15,
author = {Halil K{\"{u}}kner and
Pieter Weckx and
S{\'{e}}bastien Morrison and
Jacopo Franco and
Maria Toledano{-}Luque and
Moonju Cho and
Praveen Raghavan and
Ben Kaczer and
Doyoung Jang and
Kenichi Miyaguchi and
Marie Garcia Bardon and
Francky Catthoor and
Liesbet Van der Perre and
Rudy Lauwereins and
Guido Groeseneken},
title = {Comparison of {NBTI} aging on adder architectures and ring oscillators
in the downscaling technology nodes},
journal = {Microprocess. Microsystems},
volume = {39},
number = {8},
pages = {1039--1051},
year = {2015},
url = {https://doi.org/10.1016/j.micpro.2015.06.008},
doi = {10.1016/J.MICPRO.2015.06.008},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/KuknerWMFTCRKJM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/WeckxKRFSRLTVCG15,
author = {Pieter Weckx and
Ben Kaczer and
Praveen Raghavan and
Jacopo Franco and
Marko Simicic and
Philippe J. Roussel and
Dimitri Linten and
Aaron Thean and
Diederik Verkest and
Francky Catthoor and
Guido Groeseneken},
title = {Characterization and simulation methodology for time-dependent variability
in advanced technologies},
booktitle = {2015 {IEEE} Custom Integrated Circuits Conference, {CICC} 2015, San
Jose, CA, USA, September 28-30, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/CICC.2015.7338379},
doi = {10.1109/CICC.2015.7338379},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/cicc/WeckxKRFSRLTVCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KaczerFWRBCDLGK15,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Erik Bury and
Moonju Cho and
Robin Degraeve and
Dimitri Linten and
Guido Groeseneken and
Halil Kukner and
Praveen Raghavan and
Francky Catthoor and
Gerhard Rzepa and
Wolfgang G{\"{o}}s and
Tibor Grasser},
title = {The defect-centric perspective of device and circuit reliability -
From individual defects to circuits},
booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
Graz, Austria, September 14-18, 2015},
pages = {218--225},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ESSDERC.2015.7324754},
doi = {10.1109/ESSDERC.2015.7324754},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/KaczerFWRBCDLGK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/ChenGFDRGJ15,
author = {C. Y. Chen and
Ludovic Goux and
Andrea Fantini and
Robin Degraeve and
Augusto Redolfi and
Guido Groeseneken and
Malgorzata Jurczak},
title = {Engineering of a TiN{\textbackslash}Al2O3{\textbackslash}(Hf, Al)O2{\textbackslash}Ta2O5{\textbackslash}Hf
{RRAM} cell for fast operation at low current},
booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
Graz, Austria, September 14-18, 2015},
pages = {262--265},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ESSDERC.2015.7324764},
doi = {10.1109/ESSDERC.2015.7324764},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/ChenGFDRGJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/BoschkeGSCHVL15,
author = {Roman Boschke and
Guido Groeseneken and
Mirko Scholz and
Shih{-}Hung Chen and
Geert Hellings and
Peter Verheyen and
Dimitri Linten},
title = {{ESD} protection diodes in optical interposer technology},
booktitle = {2015 International Conference on {IC} Design {\&} Technology,
{ICICDT} 2015, Leuven, Belgium, June 1-3, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICICDT.2015.7165912},
doi = {10.1109/ICICDT.2015.7165912},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/BoschkeGSCHVL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/WeckxKRCG15,
author = {Pieter Weckx and
Ben Kaczer and
Philippe J. Roussel and
Francky Catthoor and
Guido Groeseneken},
title = {Impact of time-dependent variability on the yield and performance
of 6T {SRAM} cells in an advanced {HK/MG} technology},
booktitle = {2015 International Conference on {IC} Design {\&} Technology,
{ICICDT} 2015, Leuven, Belgium, June 1-3, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICICDT.2015.7165896},
doi = {10.1109/ICICDT.2015.7165896},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/WeckxKRCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrancoKRBMRGHTG15,
author = {Jacopo Franco and
Ben Kaczer and
Philippe J. Roussel and
Erik Bury and
Hans Mertens and
Romain Ritzenthaler and
Tibor Grasser and
Naoto Horiguchi and
Aaron Thean and
Guido Groeseneken},
title = {{NBTI} in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability
from planar to 3D architectures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {2},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112694},
doi = {10.1109/IRPS.2015.7112694},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrancoKRBMRGHTG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JiLBHCAZMIFKZGZ15,
author = {Zhigang Ji and
Dimitri Linten and
Roman Boschke and
Geert Hellings and
S. H. Chen and
AliReza Alian and
D. Zhou and
Yves Mols and
Tsvetan Ivanov and
Jacopo Franco and
Ben Kaczer and
X. Zhang and
R. Gao and
Jianfu Zhang and
Weidong Zhang and
Nadine Collaert and
Guido Groeseneken},
title = {{ESD} characterization of planar InGaAs devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112719},
doi = {10.1109/IRPS.2015.7112719},
timestamp = {Mon, 07 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/JiLBHCAZMIFKZGZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
author = {Ben Kaczer and
Jacopo Franco and
M. Cho and
Tibor Grasser and
Philippe J. Roussel and
Stanislav Tyaginov and
M. Bina and
Yannick Wimmer and
Luis{-}Miguel Procel and
Lionel Trojman and
Felice Crupi and
Gregory Pitner and
Vamsi Putcha and
Pieter Weckx and
Erik Bury and
Z. Ji and
An De Keersgieter and
Thomas Chiarella and
Naoto Horiguchi and
Guido Groeseneken and
Aaron Thean},
title = {Origins and implications of increased channel hot carrier variability
in nFinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112706},
doi = {10.1109/IRPS.2015.7112706},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WeckxKCFBCWRCG15,
author = {Pieter Weckx and
Ben Kaczer and
C. Chen and
Jacopo Franco and
Erik Bury and
K. Chanda and
J. Watt and
Philippe J. Roussel and
Francky Catthoor and
Guido Groeseneken},
title = {Characterization of time-dependent variability using 32k transistor
arrays in an advanced {HK/MG} technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112702},
doi = {10.1109/IRPS.2015.7112702},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WeckxKCFBCWRCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BeekMRDSMKMG15,
author = {Simon Van Beek and
Koen Martens and
Philippe Roussel and
Gabriele Luca Donadio and
Johan Swerts and
Sofie Mertens and
Gouri Sankar Kar and
Tai Min and
Guido Groeseneken},
title = {Four point probe ramped voltage stress as an efficient method to understand
breakdown of {STT-MRAM} MgO tunnel junctions},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112818},
doi = {10.1109/IRPS.2015.7112818},
timestamp = {Fri, 01 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BeekMRDSMKMG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VaisMFLARSCTHGD15,
author = {Abhitosh Vais and
Koen Martens and
Jacopo Franco and
Dennis Lin and
AliReza Alian and
Philippe Roussel and
S. Sioncke and
Nadine Collaert and
Aaron Thean and
Marc M. Heyns and
Guido Groeseneken and
Kristin De Meyer},
title = {The relationship between border traps characterized by {AC} admittance
and {BTI} in {III-V} {MOS} devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {5},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112742},
doi = {10.1109/IRPS.2015.7112742},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VaisMFLARSCTHGD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuMJHBSGDR15,
author = {Tian{-}Li Wu and
Denis Marcon and
Brice De Jaeger and
Marleen Van Hove and
Benoit Bakeroot and
Steve Stoffels and
Guido Groeseneken and
Stefaan Decoutere and
Robin Roelofs},
title = {Time dependent dielectric breakdown {(TDDB)} evaluation of {PE-ALD}
SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and
E-mode MIS-FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112769},
doi = {10.1109/IRPS.2015.7112769},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuMJHBSGDR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouLVICMKITTG14,
author = {Chunmeng Dou and
Dennis Lin and
Abhitosh Vais and
Tsvetan Ivanov and
Han{-}Ping Chen and
Koen Martens and
Kuniyuki Kakushima and
Hiroshi Iwai and
Yuan Taur and
Aaron Thean and
Guido Groeseneken},
title = {Determination of energy and spatial distribution of oxide border traps
in In\({}_{\mbox{0.53}}\)Ga\({}_{\mbox{0.47}}\)As {MOS} capacitors
from capacitance-voltage characteristics measured at various temperatures},
journal = {Microelectron. Reliab.},
volume = {54},
number = {4},
pages = {746--754},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2013.12.023},
doi = {10.1016/J.MICROREL.2013.12.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DouLVICMKITTG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuSLRVYBGD14,
author = {Jie Hu and
Steve Stoffels and
Silvia Lenci and
Nicolo Ronchi and
Rafael Venegas and
Shuzhen You and
Benoit Bakeroot and
Guido Groeseneken and
Stefaan Decoutere},
title = {Physical origin of current collapse in Au-free AlGaN/GaN Schottky
Barrier Diodes},
journal = {Microelectron. Reliab.},
volume = {54},
number = {9-10},
pages = {2196--2199},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.07.031},
doi = {10.1016/J.MICROREL.2014.07.031},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuSLRVYBGD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuMSYJHGD14,
author = {Tian{-}Li Wu and
Denis Marcon and
Steve Stoffels and
Shuzhen You and
Brice De Jaeger and
Marleen Van Hove and
Guido Groeseneken and
Stefaan Decoutere},
title = {Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs
under a constant current stress},
journal = {Microelectron. Reliab.},
volume = {54},
number = {9-10},
pages = {2232--2236},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.07.076},
doi = {10.1016/J.MICROREL.2014.07.076},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WuMSYJHGD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HattaJZZSKGG14,
author = {Sharifah Wan Muhamad Hatta and
Zhigang Ji and
Jianfu Zhang and
Weidong Zhang and
Norhayati Soin and
Ben Kaczer and
Stefan De Gendt and
Guido Groeseneken},
title = {Energy distribution of positive charges in high-k dielectric},
journal = {Microelectron. Reliab.},
volume = {54},
number = {9-10},
pages = {2329--2333},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.07.030},
doi = {10.1016/J.MICROREL.2014.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HattaJZZSKGG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/CamargoKWGG14,
author = {Vinicius V. A. Camargo and
Ben Kaczer and
Gilson I. Wirth and
Tibor Grasser and
Guido Groeseneken},
title = {Use of {SSTA} Tools for Evaluating {BTI} Impact on Combinational Circuits},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {22},
number = {2},
pages = {280--285},
year = {2014},
url = {https://doi.org/10.1109/TVLSI.2013.2240323},
doi = {10.1109/TVLSI.2013.2240323},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/CamargoKWGG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KuknerWMRKCPLG14,
author = {Halil Kukner and
Pieter Weckx and
Sebastien Morrison and
Praveen Raghavan and
Ben Kaczer and
Francky Catthoor and
Liesbet Van der Perre and
Rudy Lauwereins and
Guido Groeseneken},
title = {{NBTI} Aging on 32-Bit Adders in the Downscaling Planar {FET} Technology
Nodes},
booktitle = {17th Euromicro Conference on Digital System Design, {DSD} 2014, Verona,
Italy, August 27-29, 2014},
pages = {98--107},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DSD.2014.82},
doi = {10.1109/DSD.2014.82},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KuknerWMRKCPLG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BhoolokamNCSGGGH14,
author = {Ajay Bhoolokam and
Manoj Nag and
Adrian Vaisman Chasin and
Soeren Steudel and
Jan Genoe and
Gerwin H. Gelinck and
Guido Groeseneken and
Paul Heremans},
title = {Impact of etch stop layer on negative bias illumination stress of
amorphous Indium Gallium Zinc Oxide transistors},
booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
Venice Lido, Italy, September 22-26, 2014},
pages = {302--304},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ESSDERC.2014.6948820},
doi = {10.1109/ESSDERC.2014.6948820},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/BhoolokamNCSGGGH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/KuknerKMWRKCPLG14,
author = {Halil Kukner and
Moustafa A. Khatib and
Sebastien Morrison and
Pieter Weckx and
Praveen Raghavan and
Ben Kaczer and
Francky Catthoor and
Liesbet Van der Perre and
Rudy Lauwereins and
Guido Groeseneken},
title = {Degradation analysis of datapath logic subblocks under {NBTI} aging
in FinFET technology},
booktitle = {Fifteenth International Symposium on Quality Electronic Design, {ISQED}
2014, Santa Clara, CA, USA, March 3-5, 2014},
pages = {473--479},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ISQED.2014.6783362},
doi = {10.1109/ISQED.2014.6783362},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/KuknerKMWRKCPLG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/KuknerWRKCPLG13,
author = {Halil K{\"{u}}kner and
Pieter Weckx and
Praveen Raghavan and
Ben Kaczer and
Francky Catthoor and
Liesbet Van der Perre and
Rudy Lauwereins and
Guido Groeseneken},
title = {Impact of duty factor, stress stimuli, gate and drive strength on
gate delay degradation with an atomistic trap-based {BTI} model},
journal = {Microprocess. Microsystems},
volume = {37},
number = {8-A},
pages = {792--800},
year = {2013},
url = {https://doi.org/10.1016/j.micpro.2013.04.009},
doi = {10.1016/J.MICPRO.2013.04.009},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/KuknerWRKCPLG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/HellingsCLSG13,
author = {Geert Hellings and
Shih{-}Hung Chen and
Dimitri Linten and
Mirko Scholz and
Guido Groeseneken},
title = {Quasi-3D method: Time-efficient {TCAD} and mixed-mode simulations
on finFET technologies},
booktitle = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
{CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
pages = {1--4},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/CICC.2013.6658493},
doi = {10.1109/CICC.2013.6658493},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/cicc/HellingsCLSG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HamdiouiNGGGB13,
author = {Said Hamdioui and
Michael Nicolaidis and
Dimitris Gizopoulos and
Arnaud Grasset and
Guido Groeseneken and
Philippe Bonnot},
editor = {Enrico Macii},
title = {Reliability challenges of real-time systems in forthcoming technology
nodes},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {129--134},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.040},
doi = {10.7873/DATE.2013.040},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/HamdiouiNGGGB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/AoulaicheSRSACKGHTFCSCFNSN13,
author = {Marc Aoulaiche and
Eddy Simoen and
Romain Ritzenthaler and
Tom Schram and
Hiroaki Arimura and
Moonju Cho and
Thomas Kauerauf and
Guido Groeseneken and
Naoto Horiguchi and
Aaron Thean and
Antonio Federico and
Felice Crupi and
Alessio Spessot and
Christian Caillat and
Pierre Fazan and
Hyuokju Na and
Y. Son and
K. B. Noh},
title = {Impact of Al2O3 position on performances and reliability in high-k
metal gated {DRAM} periphery transistors},
booktitle = {Proceedings of the European Solid-State Device Research Conference,
{ESSDERC} 2013, Bucharest, Romania, September 16-20, 2013},
pages = {190--193},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ESSDERC.2013.6818851},
doi = {10.1109/ESSDERC.2013.6818851},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/AoulaicheSRSACKGHTFCSCFNSN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Toledano-LuqueKFRGG12,
author = {Maria Toledano{-}Luque and
Ben Kaczer and
Jacopo Franco and
Philippe Roussel and
Tibor Grasser and
Guido Groeseneken},
title = {Defect-centric perspective of time-dependent {BTI} variability},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {1883--1890},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.120},
doi = {10.1016/J.MICROREL.2012.06.120},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Toledano-LuqueKFRGG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FrancoGKCRGG12,
author = {Jacopo Franco and
S. Graziano and
Ben Kaczer and
Felice Crupi and
Lars{-}{\AA}ke Ragnarsson and
Tibor Grasser and
Guido Groeseneken},
title = {{BTI} reliability of ultra-thin {EOT} MOSFETs for sub-threshold logic},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {1932--1935},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.058},
doi = {10.1016/J.MICROREL.2012.06.058},
timestamp = {Fri, 04 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FrancoGKCRGG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/CrupiAFMTHG12,
author = {Felice Crupi and
Massimo Alioto and
Jacopo Franco and
Paolo Magnone and
Mitsuhiro Togo and
N. Horiguchi and
Guido Groeseneken},
title = {Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold
Logic Circuits From Device Measurements},
journal = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
volume = {59-II},
number = {7},
pages = {439--442},
year = {2012},
url = {https://doi.org/10.1109/TCSII.2012.2200171},
doi = {10.1109/TCSII.2012.2200171},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcas/CrupiAFMTHG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/CrupiAFMKGMWH12,
author = {Felice Crupi and
Massimo Alioto and
Jacopo Franco and
Paolo Magnone and
Ben Kaczer and
Guido Groeseneken and
J{\'{e}}r{\^{o}}me Mitard and
Liesbeth Witters and
Thomas Y. Hoffmann},
title = {Buried Silicon-Germanium pMOSFETs: Experimental Analysis in {VLSI}
Logic Circuits Under Aggressive Voltage Scaling},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {20},
number = {8},
pages = {1487--1495},
year = {2012},
url = {https://doi.org/10.1109/TVLSI.2011.2159870},
doi = {10.1109/TVLSI.2011.2159870},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/CrupiAFMKGMWH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KuknerWRKCPLG12,
author = {Halil Kukner and
Pieter Weckx and
Praveen Raghavan and
Ben Kaczer and
Francky Catthoor and
Liesbet Van der Perre and
Rudy Lauwereins and
Guido Groeseneken},
title = {Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on
Gate Delay Degradation with an Atomistic Trap-Based {BTI} Model},
booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
Izmir, Turkey, September 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/DSD.2012.77},
doi = {10.1109/DSD.2012.77},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KuknerWRKCPLG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/RitzenthalerSBMRGHTSCSF12,
author = {Romain Ritzenthaler and
Tom Schram and
Erik Bury and
J{\'{e}}r{\^{o}}me Mitard and
L.{-}{\AA}. Ragnarsson and
Guido Groeseneken and
N. Horiguchi and
Aaron Thean and
Alessio Spessot and
Christian Caillat and
V. Srividya and
Pierre Fazan},
title = {Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks},
booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference,
{ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
pages = {242--245},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ESSDERC.2012.6343378},
doi = {10.1109/ESSDERC.2012.6343378},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/RitzenthalerSBMRGHTSCSF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/ZhangCWGJ12,
author = {Leqi Zhang and
Stefan Cosemans and
Dirk J. Wouters and
Guido Groeseneken and
Malgorzata Jurczak},
title = {Analysis of the effect of cell parameters on the maximum {RRAM} array
size considering both read and write},
booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference,
{ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
pages = {282--285},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ESSDERC.2012.6343388},
doi = {10.1109/ESSDERC.2012.6343388},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/ZhangCWGJ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/RomeoPSKTHMTGCC12,
author = {Tommaso Romeo and
Luigi Pantisano and
Eddy Simoen and
Raymond Krom and
Mitsuhiro Togo and
N. Horiguchi and
J{\'{e}}r{\^{o}}me Mitard and
Aaron Thean and
Guido Groeseneken and
Cor Claeys and
Felice Crupi},
title = {Low-frequency noise assessment of the transport mechanisms in SiGe
channel bulk FinFETs},
booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference,
{ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
pages = {330--333},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ESSDERC.2012.6343400},
doi = {10.1109/ESSDERC.2012.6343400},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/RomeoPSKTHMTGCC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/FrancoKMTCERGCK12,
author = {Jacopo Franco and
Ben Kaczer and
J{\'{e}}r{\^{o}}me Mitard and
Maria Toledano{-}Luque and
Felice Crupi and
Geert Eneman and
Ph. J. Rousse and
Tibor Grasser and
M. Cho and
Thomas Kauerauf and
Liesbeth Witters and
Geert Hellings and
L.{-}{\AA}. Ragnarsson and
Naoto Horiguchi and
Marc M. Heyns and
Guido Groeseneken},
title = {Superior reliability and reduced Time-Dependent variability in high-mobility
SiGe channel pMOSFETs for {VLSI} logic applications},
booktitle = {{IEEE} International Conference on {IC} Design {\&} Technology,
{ICICDT} 2012, Austin, TX, USA, May 30 - June 1, 2012},
pages = {1--4},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ICICDT.2012.6232839},
doi = {10.1109/ICICDT.2012.6232839},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/FrancoKMTCERGCK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FeijooCTAG11,
author = {P. C. Feijoo and
Moonju Cho and
Mitsuhiro Togo and
E. San Andr{\'{e}}s and
Guido Groeseneken},
title = {Positive bias temperature instabilities on sub-nanometer {EOT} FinFETs},
journal = {Microelectron. Reliab.},
volume = {51},
number = {9-11},
pages = {1521--1524},
year = {2011},
url = {https://doi.org/10.1016/j.microrel.2011.06.014},
doi = {10.1016/J.MICROREL.2011.06.014},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FeijooCTAG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/CrupiAFMKGMWH11,
author = {Felice Crupi and
Massimo Alioto and
Jacopo Franco and
Paolo Magnone and
Ben Kaczer and
Guido Groeseneken and
J{\'{e}}r{\^{o}}me Mitard and
Liesbeth Witters and
Thomas Y. Hoffmann},
title = {Experimental analysis of buried SiGe pMOSFETs from the perspective
of aggressive voltage scaling},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2011), May
15-19 2011, Rio de Janeiro, Brazil},
pages = {2249--2252},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ISCAS.2011.5938049},
doi = {10.1109/ISCAS.2011.5938049},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/CrupiAFMKGMWH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SangameswaranCGW10,
author = {Sandeep Sangameswaran and
Jeroen De Coster and
Guido Groeseneken and
Ingrid De Wolf},
title = {Impact of design factors and environment on the {ESD} sensitivity
of {MEMS} micromirrors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1383--1387},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.079},
doi = {10.1016/J.MICROREL.2010.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SangameswaranCGW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/SubramanianMPDGSD10,
author = {Vaidyanathan Subramanian and
Abdelkarim Mercha and
Bertrand Parvais and
Morin Dehan and
Guido Groeseneken and
Willy M. C. Sansen and
Stefaan Decoutere},
title = {Identifying the Bottlenecks to the {RF} Performance of FinFETs},
booktitle = {{VLSI} Design 2010: 23rd International Conference on {VLSI} Design,
9th International Conference on Embedded Systems, Bangalore, India,
3-7 January 2010},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VLSI.Design.2010.19},
doi = {10.1109/VLSI.DESIGN.2010.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/SubramanianMPDGSD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fernandez-GarciaKG09,
author = {R. Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
Ben Kaczer and
Guido Groeseneken},
title = {A {CMOS} circuit for evaluating the {NBTI} over a wide frequency range},
journal = {Microelectron. Reliab.},
volume = {49},
number = {8},
pages = {885--891},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.05.009},
doi = {10.1016/J.MICROREL.2009.05.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fernandez-GarciaKG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LintenTBDTSNWDG09,
author = {Dimitri Linten and
Steven Thijs and
Jonathan Borremans and
Morin Dehan and
David Tr{\'{e}}mouilles and
Mirko Scholz and
M. I. Natarajan and
Piet Wambacq and
Stefaan Decoutere and
Guido Groeseneken},
title = {A plug-and-play wideband {RF} circuit {ESD} protection methodology:
T-diodes},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1440--1446},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.10.011},
doi = {10.1016/J.MICROREL.2009.10.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LintenTBDTSNWDG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tim/ScholzLTSSNHG09,
author = {Mirko Scholz and
Dimitri Linten and
Steven Thijs and
Sandeep Sangameswaran and
Masanori Sawada and
Toshiyuki Nakaei and
Takumi Hasebe and
Guido Groeseneken},
title = {{ESD} On-Wafer Characterization: Is {TLP} Still the Right Measurement
Tool?},
journal = {{IEEE} Trans. Instrum. Meas.},
volume = {58},
number = {10},
pages = {3418--3426},
year = {2009},
url = {https://doi.org/10.1109/TIM.2009.2017657},
doi = {10.1109/TIM.2009.2017657},
timestamp = {Mon, 08 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tim/ScholzLTSSNHG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GroesenekenWMB08,
author = {Guido Groeseneken and
Ingrid De Wolf and
A. J. Mouthaan and
Jaap Bisschop},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1111},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.058},
doi = {10.1016/J.MICROREL.2008.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GroesenekenWMB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/ThijsOBJLSWG08,
author = {Steven Thijs and
Mototsugu Okushima and
Jonathan Borremans and
Philippe Jansen and
Dimitri Linten and
Mirko Scholz and
Piet Wambacq and
Guido Groeseneken},
title = {Inductor-based {ESD} protection under CDM-like {ESD} stress conditions
for {RF} applications},
booktitle = {Proceedings of the {IEEE} 2008 Custom Integrated Circuits Conference,
{CICC} 2008, DoubleTree Hotel, San Jose, California, USA, September
21-24, 2008},
pages = {49--52},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/CICC.2008.4672017},
doi = {10.1109/CICC.2008.4672017},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/cicc/ThijsOBJLSWG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GielenWMLMKGRN08,
author = {Georges G. E. Gielen and
Pieter De Wit and
Elie Maricau and
Johan Loeckx and
Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Ben Kaczer and
Guido Groeseneken and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a},
editor = {Donatella Sciuto},
title = {Emerging Yield and Reliability Challenges in Nanometer {CMOS} Technologies},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {1322--1327},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484862},
doi = {10.1109/DATE.2008.4484862},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/GielenWMLMKGRN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShickovaKVAHMGK07,
author = {A. Shickova and
Ben Kaczer and
Anabela Veloso and
Marc Aoulaiche and
M. Houssa and
Herman E. Maes and
Guido Groeseneken and
J. A. Kittl},
title = {{NBTI} reliability of Ni FUSI/HfSiON gates: Effect of silicide phase},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {505--507},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.046},
doi = {10.1016/J.MICROREL.2007.01.046},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShickovaKVAHMGK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerberPVGK07,
author = {A. Kerber and
Luigi Pantisano and
Anabela Veloso and
Guido Groeseneken and
Martin Kerber},
title = {Reliability screening of high-k dielectrics based on voltage ramp
stress},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {513--517},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.030},
doi = {10.1016/J.MICROREL.2007.01.030},
timestamp = {Fri, 09 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KerberPVGK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerDRG07,
author = {Ben Kaczer and
Robin Degraeve and
Philippe Roussel and
Guido Groeseneken},
title = {Gate oxide breakdown in {FET} devices and circuits: From nanoscale
physics to system-level reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {559--566},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.063},
doi = {10.1016/J.MICROREL.2007.01.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaczerDRG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoussaAGGH07,
author = {M. Houssa and
Marc Aoulaiche and
Stefan De Gendt and
Guido Groeseneken and
Marc M. Heyns},
title = {Negative bias temperature instabilities in HfSiO(N)-based MOSFETs:
Electrical characterization and modeling},
journal = {Microelectron. Reliab.},
volume = {47},
number = {6},
pages = {880--889},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.10.010},
doi = {10.1016/J.MICROREL.2006.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoussaAGGH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TremouillesTRNVG07,
author = {David Tr{\'{e}}mouilles and
Steven Thijs and
Philippe Roussel and
M. I. Natarajan and
Vesselin K. Vassilev and
Guido Groeseneken},
title = {Transient voltage overshoot in {TLP} testing - Real or artifact?},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1016--1024},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.004},
doi = {10.1016/J.MICROREL.2006.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TremouillesTRNVG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/ParvaisSMDWSGD07,
author = {Bertrand Parvais and
Vaidyanathan Subramanian and
Abdelkarim Mercha and
Morin Dehan and
Piet Wambacq and
Willy Sansen and
Guido Groeseneken and
Stefaan Decoutere},
title = {FinFET technology for analog and {RF} circuits},
booktitle = {14th {IEEE} International Conference on Electronics, Circuits, and
Systems, {ICECS} 2007, Marrakech, Morocco, December 11-14, 2007},
pages = {182--185},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ICECS.2007.4510960},
doi = {10.1109/ICECS.2007.4510960},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/ParvaisSMDWSGD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThijsILJDDSDG06,
author = {Steven Thijs and
M. Natarajan Iyer and
Dimitri Linten and
Wutthinan Jeamsaksiri and
T. Daenen and
Robin Degraeve and
Andries J. Scholten and
Stefaan Decoutere and
Guido Groeseneken},
title = {Implementation of plug-and-play {ESD} protection in 5.5GHz 90nm {RF}
{CMOS} LNAs - Concepts, constraints and solutions},
journal = {Microelectron. Reliab.},
volume = {46},
number = {5-6},
pages = {702--712},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2005.06.018},
doi = {10.1016/J.MICROREL.2005.06.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ThijsILJDDSDG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FernandezRNAKG06,
author = {Raul Fern{\'{a}}ndez and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
Ben Kaczer and
Guido Groeseneken},
title = {FinFET and {MOSFET} preliminary comparison of gate oxide reliability},
journal = {Microelectron. Reliab.},
volume = {46},
number = {9-11},
pages = {1608--1611},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2006.07.043},
doi = {10.1016/J.MICROREL.2006.07.043},
timestamp = {Wed, 14 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FernandezRNAKG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevTSWLGNMS05,
author = {Vesselin K. Vassilev and
Steven Thijs and
P. L. Segura and
Piet Wambacq and
Paul Leroux and
Guido Groeseneken and
M. I. Natarajan and
Herman E. Maes and
Michiel Steyaert},
title = {{ESD-RF} co-design methodology for the state of the art {RF-CMOS}
blocks},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {255--268},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.013},
doi = {10.1016/J.MICROREL.2004.05.013},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevTSWLGNMS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiTRGM05,
author = {Yunlong Li and
Zsolt T{\"{o}}kei and
Philippe Roussel and
Guido Groeseneken and
Karen Maex},
title = {Layout dependency induced deviation from Poisson area scaling in {BEOL}
dielectric reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1299--1304},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.010},
doi = {10.1016/J.MICROREL.2005.07.010},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiTRGM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevVJGB05,
author = {Vesselin K. Vassilev and
Vladislav A. Vashchenko and
Philippe Jansen and
Guido Groeseneken and
Marcel ter Beek},
title = {{ESD} circuit model based protection network optimisation for extended-voltage
{NMOS} drivers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1430--1435},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.037},
doi = {10.1016/J.MICROREL.2005.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevVJGB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/JansenTLNVLCTNS05,
author = {Philippe Jansen and
Steven Thijs and
Dimitri Linten and
M. I. Natarajan and
Vesselin K. Vassilev and
Mingxu Liu and
Ann Concannon and
David Tr{\'{e}}mouilles and
Takeshi Nakaie and
Masanori Sawada and
Vladislav A. Vashchenko and
Marcel ter Beek and
Takumi Hasebe and
Stefaan Decoutere and
Guido Groeseneken},
title = {{RF} {ESD} protection strategies - the design and performance trade-off
challenges},
booktitle = {Proceedings of the {IEEE} 2005 Custom Integrated Circuits Conference,
{CICC} 2005, DoubleTree Hotel, San Jose, California, USA, September
18-21, 2005},
pages = {489--496},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/CICC.2005.1568713},
doi = {10.1109/CICC.2005.1568713},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/cicc/JansenTLNVLCTNS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AresuCbGMMWG04,
author = {Stefano Aresu and
Ward De Ceuninck and
Geert Van den Bosch and
Guido Groeseneken and
Peter Moens and
Jean Manca and
D. Wojciechowski and
P. Gassot},
title = {Evidence for source side injection hot carrier effects on lateral
{DMOS} transistors},
journal = {Microelectron. Reliab.},
volume = {44},
number = {9-11},
pages = {1621--1624},
year = {2004},
url = {https://doi.org/10.1016/j.microrel.2004.07.080},
doi = {10.1016/J.MICROREL.2004.07.080},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AresuCbGMMWG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevVJCCYGNBHSM04,
author = {Vesselin K. Vassilev and
Vladislav A. Vashchenko and
Philippe Jansen and
B.{-}J. Choi and
Ann Concannon and
J.{-}J. Yang and
Guido Groeseneken and
M. I. Natarajan and
Marcel ter Beek and
Peter Hopper and
Michiel Steyaert and
Herman E. Maes},
title = {A {CAD} assisted design and optimisation methodology for over-voltage
{ESD} protection circuits},
journal = {Microelectron. Reliab.},
volume = {44},
number = {9-11},
pages = {1885--1890},
year = {2004},
url = {https://doi.org/10.1016/j.microrel.2004.07.102},
doi = {10.1016/J.MICROREL.2004.07.102},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VassilevVJCCYGNBHSM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevJGVTHNSM03,
author = {Vesselin K. Vassilev and
Snezana Jenei and
Guido Groeseneken and
Rafael Venegas and
Steven Thijs and
Vincent De Heyn and
M. Natarajan Iyer and
Michiel Steyaert and
Herman E. Maes},
title = {High frequency characterization and modelling of the parasitic {RC}
performance of two terminal {ESD} {CMOS} protection devices},
journal = {Microelectron. Reliab.},
volume = {43},
number = {7},
pages = {1011--1020},
year = {2003},
url = {https://doi.org/10.1016/S0026-2714(03)00129-X},
doi = {10.1016/S0026-2714(03)00129-X},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevJGVTHNSM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerDRKMG02,
author = {Ben Kaczer and
Robin Degraeve and
Mahmoud Rasras and
An De Keersgieter and
K. Van de Mieroop and
Guido Groeseneken},
title = {Analysis and modeling of a digital {CMOS} circuit operation and reliability
after gate oxide breakdown: a case study},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {555--564},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00026-4},
doi = {10.1016/S0026-2714(02)00026-4},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaczerDRKMG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeppensHIVG02,
author = {Bart Keppens and
Vincent De Heyn and
M. Natarajan Iyer and
Vesselin K. Vassilev and
Guido Groeseneken},
title = {Significance of the failure criterion on transmission line pulse testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {901--907},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00053-7},
doi = {10.1016/S0026-2714(02)00053-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KeppensHIVG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndriesDCCSGLDD02,
author = {E. Andries and
R. Dreesen and
Kris Croes and
Ward De Ceuninck and
Luc De Schepper and
Guido Groeseneken and
K. F. Lo and
Marc D'Olieslaeger and
Jan D'Haen},
title = {Statistical aspects of the degradation of {LDD} nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1409--1413},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00160-9},
doi = {10.1016/S0026-2714(02)00160-9},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AndriesDCCSGLDD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BockKHGCN01,
author = {Karlheinz Bock and
Bart Keppens and
Vincent De Heyn and
Guido Groeseneken and
L. Y. Ching and
A. Naem},
title = {Influence of gate length on ESD-performance for deep submicron {CMOS}
technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {375--383},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00243-2},
doi = {10.1016/S0026-2714(00)00243-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BockKHGCN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DreesenCMCSPG01,
author = {R. Dreesen and
Kris Croes and
Jean Manca and
Ward De Ceuninck and
Luc De Schepper and
A. Pergoot and
Guido Groeseneken},
title = {A new degradation model and lifetime extrapolation technique for lightly
doped drain nMOSFETs under hot-carrier degradation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {437--443},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00225-0},
doi = {10.1016/S0026-2714(00)00225-0},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DreesenCMCSPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ibmrd/HeynsBCGDGKKLMMMNSTVVW99,
author = {Marc M. Heyns and
Twan Bearda and
Ingrid Cornelissen and
Stefan De Gendt and
Robin Degraeve and
Guido Groeseneken and
Conny Kenens and
D. Martin Knotter and
Lee M. Loewenstein and
Paul W. Mertens and
Sofie Mertens and
Marc Meuris and
Tanya Nigam and
Marc Schaekers and
Ivo Teerlinck and
Wilfried Vandervorst and
Rita Vos and
Klaus Wolke},
title = {Cost-effective cleaning and high-quality thin gate oxides},
journal = {{IBM} J. Res. Dev.},
volume = {43},
number = {3},
pages = {339--350},
year = {1999},
url = {https://doi.org/10.1147/rd.433.0339},
doi = {10.1147/RD.433.0339},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ibmrd/HeynsBCGDGKKLMMMNSTVVW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/MontanariHGM98,
author = {Donato Montanari and
Jan Van Houdt and
Guido Groeseneken and
Herman E. Maes},
title = {Novel level-identifying circuit for flash multilevel memories},
journal = {{IEEE} J. Solid State Circuits},
volume = {33},
number = {7},
pages = {1090--1095},
year = {1998},
url = {https://doi.org/10.1109/4.701269},
doi = {10.1109/4.701269},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jssc/MontanariHGM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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