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Marco M. Furchi

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2010 – 2019

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2018
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  - conf/irps/IllarionovMWKFM18
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Yury Yu. Illarionov, Aday J. Molina-Mendoza, Michael Waltl, Theresia Knobloch, Marco M. Furchi, Thomas Mueller, Tibor Grasser:
Reliability of next-generation field-effect transistors with transition metal dichalcogenides. IRPS 2018: 5
2017
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Theresia Knobloch, Gerhard Rzepa, Yury Yu. Illarionov, Michael Waltl, Franz Schanovsky, Markus Jech, Bernhard Stampfer, Marco M. Furchi, Thomas Muller, Tibor Grasser:
Physical modeling of the hysteresis in M0S2 transistors. ESSDERC 2017: 284-287

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