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William D. Atwell Jr.

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1998
[j1]
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Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian:
A D&T Roundtable: Testing Mixed Logic and DRAM Chips. IEEE Des. Test Comput. 15(2): 86-92 (1998)

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