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"Comparative study on delay degrading estimation due to NBTI with ..."

Hiroaki Konoura et al. (2010)

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DOI: 10.1109/ISQED.2010.5450508

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  - conf/isqed/KonouraMHO10
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Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye:
Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration. ISQED 2010: 646-651

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