![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record phd/us/Hsu88
@phdthesis{DBLP:phd/us/Hsu88, author = {Charles Ching{-}Hsiang Hsu}, title = {A Study of Generation-Annealing - Charging of Oxide and Interface Traps in Metal-Oxide - Semiconductor Structure Using Tunneling and Hot Electron Injections}, school = {University of Illinois Urbana-Champaign, {USA}}, year = {1988}, url = {https://hdl.handle.net/2142/69384}, timestamp = {Thu, 07 Sep 2023 22:34:56 +0200}, biburl = {https://dblp.org/rec/phd/us/Hsu88.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.