"A Study of Generation-Annealing - Charging of Oxide and Interface Traps in ..."

Charles Ching-Hsiang Hsu (1988)

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type: Book or Thesis

metadata version: 2023-09-07

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Charles Ching-Hsiang Hsu:
A Study of Generation-Annealing - Charging of Oxide and Interface Traps in Metal-Oxide - Semiconductor Structure Using Tunneling and Hot Electron Injections. University of Illinois Urbana-Champaign, USA, 1988

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