BibTeX record journals/tvlsi/OshitaDK19

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@article{DBLP:journals/tvlsi/OshitaDK19,
  author       = {Takao Oshita and
                  Jonathan Douglas and
                  Arun Krishnamoorthy},
  title        = {High-Volume Testing and {DC} Offset Trimming Technique of On-Die Bandgap
                  Voltage Reference for SOCs and Microprocessors},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {27},
  number       = {4},
  pages        = {821--829},
  year         = {2019},
  url          = {https://doi.org/10.1109/TVLSI.2018.2882567},
  doi          = {10.1109/TVLSI.2018.2882567},
  timestamp    = {Wed, 11 Mar 2020 18:17:46 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/OshitaDK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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