BibTeX record journals/tvlsi/LeeYSK22

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@article{DBLP:journals/tvlsi/LeeYSK22,
  author       = {Hayoung Lee and
                  Younwoo Yoo and
                  Seung Ho Shin and
                  Sungho Kang},
  title        = {{ECMO:} {ECC} Architecture Reusing Content-Addressable Memories for
                  Obtaining High Reliability in {DRAM}},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {30},
  number       = {6},
  pages        = {781--793},
  year         = {2022},
  url          = {https://doi.org/10.1109/TVLSI.2022.3153894},
  doi          = {10.1109/TVLSI.2022.3153894},
  timestamp    = {Sun, 06 Oct 2024 21:42:03 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/LeeYSK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}