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BibTeX record journals/tvlsi/LeeYSK22
@article{DBLP:journals/tvlsi/LeeYSK22, author = {Hayoung Lee and Younwoo Yoo and Seung Ho Shin and Sungho Kang}, title = {{ECMO:} {ECC} Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in {DRAM}}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {30}, number = {6}, pages = {781--793}, year = {2022}, url = {https://doi.org/10.1109/TVLSI.2022.3153894}, doi = {10.1109/TVLSI.2022.3153894}, timestamp = {Sun, 06 Oct 2024 21:42:03 +0200}, biburl = {https://dblp.org/rec/journals/tvlsi/LeeYSK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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