BibTeX record journals/tvlsi/KeaneKK10

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@article{DBLP:journals/tvlsi/KeaneKK10,
  author       = {John Keane and
                  Tony Tae{-}Hyoung Kim and
                  Chris H. Kim},
  title        = {An On-Chip {NBTI} Sensor for Measuring pMOS Threshold Voltage Degradation},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {18},
  number       = {6},
  pages        = {947--956},
  year         = {2010},
  url          = {https://doi.org/10.1109/TVLSI.2009.2017751},
  doi          = {10.1109/TVLSI.2009.2017751},
  timestamp    = {Wed, 11 Mar 2020 18:18:09 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KeaneKK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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