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"An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation."

John Keane, Tony Tae-Hyoung Kim, Chris H. Kim (2010)

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DOI: 10.1109/TVLSI.2009.2017751

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/KeaneKK10
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  - https://dblp.org/rec/journals/tvlsi/KeaneKK10
John Keane, Tony Tae-Hyoung Kim, Chris H. Kim:
An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 947-956 (2010)

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