@article{DBLP:journals/tr/BaeKKK07,
author = {Suk Joo Bae and
Seong-Joon Kim and
Way Kuo and
Paul H. Kvam},
title = {Statistical Models for Hot Electron Degradation in Nano-Scaled
MOSFET Devices},
journal = {IEEE Transactions on Reliability},
volume = {56},
number = {3},
year = {2007},
pages = {392-400},
ee = {http://dx.doi.org/10.1109/TR.2007.903232},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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