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BibTeX record journals/tim/BiswasDP14
@article{DBLP:journals/tim/BiswasDP14, author = {Satyendra N. Biswas and Sunil R. Das and Emil M. Petriu}, title = {On System-on-Chip Testing Using Hybrid Test Vector Compression}, journal = {{IEEE} Trans. Instrum. Meas.}, volume = {63}, number = {11}, pages = {2611--2619}, year = {2014}, url = {https://doi.org/10.1109/TIM.2014.2313431}, doi = {10.1109/TIM.2014.2313431}, timestamp = {Mon, 08 Jun 2020 22:30:36 +0200}, biburl = {https://dblp.org/rec/journals/tim/BiswasDP14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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