"On System-on-Chip Testing Using Hybrid Test Vector Compression."

Satyendra N. Biswas, Sunil R. Das, Emil M. Petriu (2014)

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DOI: 10.1109/TIM.2014.2313431

access: closed

type: Journal Article

metadata version: 2020-06-08

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Satyendra N. Biswas, Sunil R. Das, Emil M. Petriu:
On System-on-Chip Testing Using Hybrid Test Vector Compression. IEEE Trans. Instrum. Meas. 63(11): 2611-2619 (2014)

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