BibTeX record journals/tie/GonzalezWJA20

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@article{DBLP:journals/tie/GonzalezWJA20,
  author       = {Jose Angel Ortiz Gonzalez and
                  Ruizhu Wu and
                  Saeed Jahdi and
                  Olayiwola Alatise},
  title        = {Performance and Reliability Review of 650 {V} and 900 {V} Silicon
                  and SiC Devices: MOSFETs, Cascode JFETs and IGBTs},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {67},
  number       = {9},
  pages        = {7375--7385},
  year         = {2020},
  url          = {https://doi.org/10.1109/TIE.2019.2945299},
  doi          = {10.1109/TIE.2019.2945299},
  timestamp    = {Thu, 27 Jul 2023 08:18:08 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/GonzalezWJA20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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