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BibTeX record journals/tie/GonzalezWJA20
@article{DBLP:journals/tie/GonzalezWJA20, author = {Jose Angel Ortiz Gonzalez and Ruizhu Wu and Saeed Jahdi and Olayiwola Alatise}, title = {Performance and Reliability Review of 650 {V} and 900 {V} Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs}, journal = {{IEEE} Trans. Ind. Electron.}, volume = {67}, number = {9}, pages = {7375--7385}, year = {2020}, url = {https://doi.org/10.1109/TIE.2019.2945299}, doi = {10.1109/TIE.2019.2945299}, timestamp = {Thu, 27 Jul 2023 08:18:08 +0200}, biburl = {https://dblp.org/rec/journals/tie/GonzalezWJA20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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