default search action
BibTeX record journals/tcad/PomeranzR02a
@article{DBLP:journals/tcad/PomeranzR02a, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {21}, number = {6}, pages = {706--714}, year = {2002}, url = {https://doi.org/10.1109/TCAD.2002.1004314}, doi = {10.1109/TCAD.2002.1004314}, timestamp = {Thu, 24 Sep 2020 11:27:54 +0200}, biburl = {https://dblp.org/rec/journals/tcad/PomeranzR02a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.