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BibTeX record journals/tcad/PomeranzR02a
@article{DBLP:journals/tcad/PomeranzR02a, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {21}, number = {6}, pages = {706--714}, year = {2002}, url = {https://doi.org/10.1109/TCAD.2002.1004314}, doi = {10.1109/TCAD.2002.1004314}, timestamp = {Thu, 24 Sep 2020 11:27:54 +0200}, biburl = {https://dblp.org/rec/journals/tcad/PomeranzR02a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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