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@article{DBLP:journals/tcad/LeeP94,
author = {Jaushin Lee and
Janak H. Patel},
title = {Architectural level test generation for microprocessors},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {13},
number = {10},
year = {1994},
pages = {1288-1300},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.317464},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-31 by Michael Ley (ley@uni-trier.de)