BibTeX record journals/tcad/KongZZCC20

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@article{DBLP:journals/tcad/KongZZCC20,
  author       = {Yachen Kong and
                  Meng Zhang and
                  Xuepeng Zhan and
                  Rui Cao and
                  Jiezhi Chen},
  title        = {Retention Correlated Read Disturb Errors in 3-D Charge Trap {NAND}
                  Flash Memory: Observations, Analysis, and Solutions},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {39},
  number       = {11},
  pages        = {4042--4051},
  year         = {2020},
  url          = {https://doi.org/10.1109/TCAD.2020.3025514},
  doi          = {10.1109/TCAD.2020.3025514},
  timestamp    = {Thu, 17 Dec 2020 18:29:37 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/KongZZCC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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