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"Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash ..."

Yachen Kong et al. (2020)

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DOI: 10.1109/TCAD.2020.3025514

access: closed

type: Journal Article

metadata version: 2020-12-17

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  - https://dblp.org/rec/journals/tcad/KongZZCC20
Yachen Kong, Meng Zhang, Xuepeng Zhan, Rui Cao, Jiezhi Chen:
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 4042-4051 (2020)

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