BibTeX record journals/tcad/ChakrabartyIK05

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@article{DBLP:journals/tcad/ChakrabartyIK05,
  author       = {Krishnendu Chakrabarty and
                  Vikram Iyengar and
                  Mark D. Krasniewski},
  title        = {Test planning for modular testing of hierarchical SOCs},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {24},
  number       = {3},
  pages        = {435--448},
  year         = {2005},
  url          = {https://doi.org/10.1109/TCAD.2004.842816},
  doi          = {10.1109/TCAD.2004.842816},
  timestamp    = {Mon, 03 Jan 2022 22:11:43 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/ChakrabartyIK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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