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"Test planning for modular testing of hierarchical SOCs."

Krishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski (2005)

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DOI: 10.1109/TCAD.2004.842816

access: closed

type: Journal Article

metadata version: 2022-01-03

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  - https://dblp.org/rec/journals/tcad/ChakrabartyIK05
Krishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski:
Test planning for modular testing of hierarchical SOCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(3): 435-448 (2005)

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