BibTeX record journals/tc/ParkMW92

download as .bib file

@article{DBLP:journals/tc/ParkMW92,
  author       = {Eun Sei Park and
                  M. Ray Mercer and
                  Thomas W. Williams},
  title        = {The Total Delay Fault Model and Statistical Delay Fault Coverage},
  journal      = {{IEEE} Trans. Computers},
  volume       = {41},
  number       = {6},
  pages        = {688--698},
  year         = {1992},
  url          = {https://doi.org/10.1109/12.144621},
  doi          = {10.1109/12.144621},
  timestamp    = {Sat, 20 May 2017 00:24:28 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/ParkMW92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.