"The Total Delay Fault Model and Statistical Delay Fault Coverage."

Eun Sei Park, M. Ray Mercer, Thomas W. Williams (1992)

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DOI: 10.1109/12.144621

access: closed

type: Journal Article

metadata version: 2017-05-20

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Eun Sei Park, M. Ray Mercer, Thomas W. Williams:
The Total Delay Fault Model and Statistical Delay Fault Coverage. IEEE Trans. Computers 41(6): 688-698 (1992)

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